AD7537

REV.

–3–

TIMING CHARACTERISTICS

Limit at

Limit at

Limit at

Parameter

to +85 C

to +125 C

Units

Test Conditions/Comments

15

15

30

ns min

Address Valid to Write Setup Time

15

15

25

ns min

Address Valid to Write Hold Time

60

80

80

ns min

Data Setup Time

25

25

25

ns min

Data Hold Time

0

0

0

ns min

Chip Select or Update to Write Setup Time

0

0

0

ns min

Chip Select or Update to Write Hold Time

80

80

100

ns min

Write Pulse Width

80

80

100

ns min

Clear Pulse Width

Specifications subject to change without notice.

ABSOLUTE MAXIMUM RATINGS*

°C unless otherwise stated)

±25 V

±25 V

Power Dissipation (Any Package)

To +75

°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 450 mW

Derates Above +75

°C . . . . . . . . . . . . . . . . . . . . . 6 mW/°C

Operating Temperature Range

Commercial Plastic (J, K, L Versions) . . . . –40

°C to +85°C

Industrial Hermetic (A, B, C Versions) . . . –40

°C to +85°C

Extended Hermetic (S, T, U Versions) . . –55

°C to +125°C

Storage Temperature . . . . . . . . . . . . . . . . –65

°C to +150°C

Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300

°C

*Stresses above those listed under “Absolute Maximum Ratings” may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions above those indicated in

the operational sections of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

WARNING!

ESD SENSITIVE DEVICE

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the AD7537 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

Figure 1. Timing Diagram

A