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MCP73833 データシート(PDF) 13 Page - Microchip Technology |
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MCP73833 データシート(HTML) 13 Page - Microchip Technology |
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13 / 26 page ![]() © 2006 Microchip Technology Inc. DS22005A-page 13 MCP73833/4 5.0 DETAILED DESCRIPTION 5.1 Analog Circuitry 5.1.1 BATTERY MANAGEMENT INPUT SUPPLY (VDD) The VDD input is the input supply to the MCP73833/4. The MCP73833/4 automatically enters a Power-down mode if the voltage on the VDD input falls below the UVLO voltage (VSTOP). This feature prevents draining the battery pack when the VDD supply is not present. 5.1.2 CURRENT REGULATION SET (PROG) Fast charge current regulation can be scaled by placing a programming resistor (RPROG) from the PROG input to VSS. The program resistor and the charge current are calculated using the Equation 5-1: EQUATION 5-1: The preconditioning trickle-charge current and the charge termination current are ratiometric to the fast charge current based on the selected device options. 5.1.3 BATTERY CHARGE CONTROL OUTPUT (VBAT) The battery charge control output is the drain terminal of an internal P-channel MOSFET. The MCP73833/4 provides constant current and voltage regulation to the battery pack by controlling this MOSFET in the linear region. The battery charge control output should be connected to the positive terminal of the battery pack. 5.1.4 TEMPERATURE QUALIFICATION (THERM) The MCP73833/4 continuously monitors battery temperature during a charge cycle by measuring the voltage between the THERM and VSS pins. An internal 50 µA current source provides the bias for most common 10 k Ω negative-temperature coefficient (NTC) or positive-temperature coefficient (PTC) thermistors.The current source is controlled, avoiding measurement sensitivity to fluctuations in the supply voltage (VDD). The MCP73833/4 compares the voltage at the THERM pin to factory set thersholds of 1.20V and 0.25V, typically. Once a volage outside the thresholds is detected during a charge cycle, the MCP73833/4 immediately suspends the charge cycle. The MCP73833/4 suspends charge by turning off the pass transistor and holding the timer value. The charge cycle resumes when the voltage at the THERM pin returns to the normal range. If temperature monitoring is not required, place a standard 10 k Ω resistor from THERM to VSS 5.1.4.1 System Test (LDO) Mode The MCP73833/4 can be placed in a system test mode. In this mode, the MCP73833/4 operates as a low dropout linear regulator (LDO). The output voltage is regulated to the factory set voltage regulation option. The available output current is limitted to the programmed fast charge current. For stability, the VBAT output must be bypassed to VSS with a minimum capacitance of 1 µF for output currents up to 250 mA. A minimum capacitance of 4.7 µF is required for output currents above 250 mA. The system test mode is entered by driving the THERM input greater than (VDD-100 mV) with no battery connected to the output. In this mode, the MCP73833/4 can be used to power the system without a battery present. 5.2 Digital Circuitry 5.2.1 STATUS INDICATORS AND POWER GOOD (PG - OPTION) The charge status outputs have two different states: Low (L), and High Impedance (Hi-Z). The charge status outputs can be used to illuminate LEDs. Optionally, the charge status outputs can be used as an interface to a host microcontroller. Table 5-1 summarize the state of the status outputs during a charge cycle. IREG 1000V RPROG ----------------- = Where: RPROG = kilo-ohms IREG = milliampere Note 1: ITHERM is disabled during shutdown, stand-by, and system test modes. 2: A pull-down current source on the THERM input is active only in stand-by and system test modes. 3: During system test mode, the PROG input sets the available output current limit. 4: System test mode shall be exited by releasing the THERM input or cycling input power. TABLE 5-1: STATUS OUTPUTS CHARGE CYCLE STATE STAT1 STAT2 PG Shutdown Hi-Z Hi-Z Hi-Z Standby Hi-Z Hi-Z L Charge in Progress L Hi-Z L Charge Complete (EOC) Hi-Z L L Temperature Fault Hi-Z Hi-Z L Timer Fault Hi-Z Hi-Z L System Test Mode L L L |
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