AM29F010-90DPC1 datasheet(6/8 Pages) AMD

部品番号	AM29F010-90DPC1

部品情報	1 Megabit (128 K x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory-Die Revision 1

PDF	8 Pages

Scroll/Zoom	100%

メーカー	AMD [Advanced Micro Devices]

ホームページ	http://www.amd.com

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6 / 8 page

Am29F010 Known Good Die

1/13/98

S U PPL EM EN T

PRODUCT TEST FLOW

Figure 1 provides an overview of AMD’s Known Good

Die test flow. For more detailed information, refer to the

Am29F010 product qualification database supplement

for KGD. AMD implements quality assurance proce-

dures throughout the product test flow. In addition, an

off-line quality monitoring program (QMP) further guar-

antees AMD quality standards are met on Known Good

Die products. These QA procedures also allow AMD to

produce KGD products without requiring or imple-

menting burn-in.

Figure 1.

AMD KGD Product Test Flow

Wafer Sort 1

Bake

24 hours at 250

°C

Wafer Sort 2

Wafer Sort 3

High Temperature

Packaging for Shipment

Shipment

DC Parameters

Functionality

Programmability

Erasability

Data Retention

DC Parameters

Functionality

Programmability

Erasability

DC Parameters

Functionality

Programmability

Erasability

Speed

Incoming Inspection

Wafer Saw

Die Separation

100% Visual Inspection

Die Pack

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