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LT1780ISW データシート(PDF) 3 Page - Linear Integrated Systems

部品番号 LT1780ISW
部品情報  Low Power 5V RS232 Dual Driver/Receiver with 15kV ESD Protection
PDF  12 Pages
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メーカー  LINEAR [Linear Integrated Systems]
ホームページ  http://www.linearsystems.com
Logo LINEAR - Linear Integrated Systems

LT1780ISW データシート(HTML) 3 Page - Linear Integrated Systems

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LT1780/LT1781
ELECTRICAL C
C
HARA TERISTICS (Note 2)
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
Logic Input Current
0.8V
≤ VIN ≤ 2.0V
q
520
µA
Output Short-Circuit Current
VOUT = 0V
±717
mA
Output Leakage Current
SHUTDOWN VOUT = ±30V (Note 4)
q
10
100
µA
Data Rate
RL = 3k, CL = 2500pF
120
kBaud
RL = 3k, CL = 1000pF
250
kBaud
Slew Rate
RL = 3k, CL = 51pF
15
30
V/
µs
RL = 3k, CL = 2500pF
4
7
V/
µs
Propagation Delay
Output Transition tHL High-to-Low (Note 5)
0.6
1.3
µs
Output Transition tLH Low-to-High
0.5
1.3
µs
Receiver
Input Voltage Thresholds
Input Low Threshold (VOUT = High)
0.8
1.3
V
Input High Threshold (VOUT = Low)
1.7
2.4
V
Hysteresis
q
0.1
0.4
1
V
Input Resistance
VIN = ±10V
357
k
Output Leakage Current
SHUTDOWN (Note 4) 0
≤ VOUT ≤ VCC
q
110
µA
Output Voltage
Output Low, IOUT = – 1.6mA
q
0.2
0.4
V
Output High, IOUT = 160µA (VCC = 5V)
q
3.5
4.2
V
Output Short-Circuit Current
Sinking Current, VOUT = VCC
–10
mA
Sourcing Current, VOUT = 0V
10
20
mA
Propagation Delay
Output Transition tHL High-to-Low (Note 6)
250
600
ns
Output Transition tLH Low-to-High
350
600
ns
Note 4: Supply current measurements in SHUTDOWN are performed with
VON/OFF ≤ 0.1V.
Note 5: For driver delay measurements, RL = 3k and CL = 51pF. Trigger
points are set between the driver’s input logic threshold and the output
transition to the zero crossing (tHL = 1.4V to 0V and tLH = 1.4V to 0V).
Note 6: For receiver delay measurements, CL = 51pF. Trigger points are
set between the receiver’s input logic threshold and the output transition
to standard TTL/CMOS logic threshold (tHL = 1.3V to 2.4V and tLH = 1.7V
to 0.8V).
The q denotes specifications which apply over the operating temperature
range.
Note 1: Absolute Maximum Ratings are those values beyond which the life
of the device may be impaired.
Note 2: Testing done at VCC = 5V and VON/OFF = 3V, unless otherwise
specified.
Note 3: Supply current is measured as the average over several charge
pump cycles. C + = C = C1 = C2 = 0.1
µF. All outputs are open, with all
driver inputs tied high.
–20



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