データシートサーチシステム
  Japanese  ▼
ALLDATASHEET.JP

X  

STM32F215RG データシート(PDF) 116 Page - STMicroelectronics

部品番号 STM32F215RG
部品情報  ARM-based 32-bit MCU, 150DMIPs, up to 1 MB Flash/1284KB RAM
PDF  173 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F215RG データシート(HTML) 116 Page - STMicroelectronics

Back Button STM32F215RG Datasheet HTML 112Page - STMicroelectronics STM32F215RG Datasheet HTML 113Page - STMicroelectronics STM32F215RG Datasheet HTML 114Page - STMicroelectronics STM32F215RG Datasheet HTML 115Page - STMicroelectronics STM32F215RG Datasheet HTML 116Page - STMicroelectronics STM32F215RG Datasheet HTML 117Page - STMicroelectronics STM32F215RG Datasheet HTML 118Page - STMicroelectronics STM32F215RG Datasheet HTML 119Page - STMicroelectronics STM32F215RG Datasheet HTML 120Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 116 / 173 page
background image
Electrical characteristics
STM32F21xxx
116/173
Doc ID 17050 Rev 8
Note:
ADC accuracy vs. negative injection current: injecting a negative current on any analog input
pins should be avoided as this significantly reduces the accuracy of the conversion being
performed on another analog input. It is recommended to add a Schottky diode (pin to
ground) to analog pins which may potentially inject negative currents.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in
Section 5.3.16 does not affect the ADC accuracy.
Figure 48.
ADC accuracy characteristics
1.
Example of an actual transfer curve.
2.
Ideal transfer curve.
3.
End point correlation line.
4.
ET = Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves.
EO = Offset Error: deviation between the first actual transition and the first ideal one.
EG = Gain Error: deviation between the last ideal transition and the last actual one.
ED = Differential Linearity Error: maximum deviation between actual steps and the ideal one.
EL = Integral Linearity Error: maximum deviation between any actual transition and the end point
correlation line.
1.
Better performance could be achieved in restricted VDD, frequency and temperature ranges.
2.
Based on characterization, not tested in production.
EO
EG
1L SBIDEAL
4095
4094
4093
5
4
3
2
1
0
7
6
1
2
3
456
7
4093 4094 4095 4096
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
ai14395c
VREF+
4096
(or
depending on package)]
VDDA
4096
[1LSBIDEAL =



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


データシート ダウンロード

Go To PDF Page


リンク URL



ALLDATASHEETはお客様のビジネスに役立ちますか?  [ DONATE ] 

Alldatasheetは   |   広告   |   お問い合わせ   |   プライバシーポリシー   |   データシートへのリンク    |   リンク交換   |   メーカーリスト
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com