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PACUSBVB データシート(PDF) 3 Page - ON Semiconductor

部品番号 PACUSBVB
部品情報  USB Downstream Port Terminator with VBUS ESD Protection
PDF  7 Pages
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

PACUSBVB データシート(HTML) 3 Page - ON Semiconductor

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SPECIFICATIONS (Cont’d)
Table 4. ELECTRICAL OPERATING CHARACTERISTICS
Symbol
Parameter
Conditions
Min
Typ
Max
Units
R1
Resistance of R1 Resistor
TA = 25C
26.4
33
39.6
W
R2
Resistance of R2 Resistor
TA = 25C
15
kW
TCR
Temperature Coefficient of Resistance
+1300
ppm/C
C1
Capacitance of C1 Capacitor
0 V DC, 30 mV AC, 1 MHz, 25C
37.6
47.0
56.4
pF
2.5 V DC, 30 mV AC, 1 MHz, 25C
25.6
32.0
38.4
pF
TOLCM
Matching Tolerance of C1 Capacitors
1 MHz, 25C
2
%
ILEAK
Diode Leakage Current to GND
Measured at 3.3 V DC, 25C
1
100
nA
VRB
Diode Reverse Bias Voltage
ILOAD = 10 mA, TA = 25C
5.5
V
VSIG
Signal Voltage:
Positive Clamp
Negative Clamp
ILOAD = 10 mA, TA = 25C
ILOAD = 10 mA, TA = 25C
5.6
−0.4
6.8
−0.8
9.0
−1.5
V
VESD
In−system ESD Withstand Voltage
MIL−STD−883D, Method 3015 (HBM)
IEC 61000−4−2 Contact Discharge
Pins 1, 3 (Notes 1 and 2)
Pins 4, 5 (Note 1)
Pins 4, 5 (Note 1)
4
20
15
kV
VCL
Clamping Voltage under ESD Discharge
MIL−STD−883D, Method 3015 +8 kV
(Note 3)
12
V
MIL−STD−883D, Method 3015 −8kV
(Note 3)
−7
V
1. ESD voltage applied to pins with respect to GND, one at a time; unused pins are left open.
2. Pins 1 and 3 are not connected to the USB port connector, and therefore are not exposed to external ESD hazards. Thus, they do not require
the high ESD protection levels provided for pins 4, 5, and 6.
3. ESD Clamping Voltage is measured at the opposite end of R1 from the pin to which the ESD discharge is applied (e.g., if ESD is applied
to pin 6, then the clamping voltage is measured at pin 1).



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