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AN4276 データシート(PDF) 17 Page - STMicroelectronics

部品番号 AN4276
部品情報  ECC management on SPC560x
PDF  21 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4276 データシート(HTML) 17 Page - STMicroelectronics

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DocID024408 Rev 2
17/21
AN4276
Application software notes
5.3.1
Check ECC immediately after each read access
Figure 9. Example of Immediate ECC check during read function
Advantage
Recognition of corrupted data in the Flash memory is immediate after the first read access.
It can help to decrease time in the case where a lot of memory words are corrupted, like
power drop during sector erase operation.
Disadvantage
ECC check needs some processing time for each read access. This increases processing
time of read operation in general.
5.3.2
Check ECC after whole data buffer is read
Figure 10. Example of ECC check after whole buffer is read
Advantage
Standard read buffer operation is not delayed with ECC check after each read access. This
gives the standard performance in case of good memory sector.
ReadBuffer ()
error = 0;
for (i=0; i < length ; ++i)
{
buffer [i] = *( mem_ptr + i);
if (MCR.EER == 1)
{
error
= 1;
break ;
}
}
if (error )
{
DoErrorAction ();
end funciton ;
}
...
IVOR 2 Handler
if (ECSM.FNCE)
{
if (DataFlash
== TRUE)
{
SRR 0 <= change to next instruction
;
return from Handler
;
}
}
1x time
ReadBuffer ()
error = 0;
for (i=0; i < length ; ++i)
{
buffer [i] = *( mem_ptr + i);
}
if (MCR.EER)
{
DoErrorAction ();
end funciton ;
}
...
IVOR 2 Handler
if (ECSM.FNCE)
{
if (DataFlash
== TRUE)
{
SRR 0 <= change to next instruction
;
return from Handler
;
}
}
i times



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