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AN3213 データシート(PDF) 40 Page - STMicroelectronics

部品番号 AN3213
部品情報  ST7570 S-FSK power line networking system-on-chip
PDF  64 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3213 データシート(HTML) 40 Page - STMicroelectronics

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ST7570 demonstration board description
AN3213
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Doc ID 17429 Rev 1
Figure 34 represents the BER vs. SNR curve in the presence of white noise for both 1200
bps and 2400 bps at 50 Hz in these conditions.
Figure 34.
Measured BER vs. SNR curve (typical), white noise
7.2.4
NBI tests
In order to test the demonstration board immunity to a narrow-band interferer (NBI), the
method described in the IEC61334-5-1 standard has been followed (References 5). It
requires a sine wave interferer at a 20 kHz < fN < 95 kHz frequency to be applied at the
receiving device. Setting an rms interferer level equal to SN and an rms signal level equal to
SS, the BER of the receiving device must be lower than 10-5 with SN/SS < 30 dB.
The waveform generator has been used to provide the sine wave signal, whereas a second
demonstration board was generating packet traffic compliant with IEC61334-5-1 at PHY
layer (standard preamble and SSD sequence followed by a random payload) (References
5).
Table 7 shows the parameters setting the test conditions. Both signal and noise levels have
been measured through a spectrum analyzer with differential probe. The resolution
bandwidth RBW was equal to 100 Hz.
The test returned a BER value lower than 10-5 for all the interferer frequencies, proving that
the demonstration board is compliant with IEC 61334-5-1 requirements on narrowband
interferer tests.
Table 7.
Narrow-band interferer immunity test settings
Parameter
Value
Received signal level
69.5 dBµV rms
Received NBI level
100.0 dBµV rms
Signal bandwidth
2400 Hz



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