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PYX28HC64 データシート(PDF) 2 Page - Pyramid Semiconductor Corporation

部品番号 PYX28HC64
部品情報  Access Times of 70, 90, and 120ns Software Data Protection
PDF  11 Pages
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メーカー  PYRAMID [Pyramid Semiconductor Corporation]
ホームページ  http://www.pyramidsemiconductor.com
Logo PYRAMID - Pyramid Semiconductor Corporation

PYX28HC64 データシート(HTML) 2 Page - Pyramid Semiconductor Corporation

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PYX28HC64 - 8K x 8 EEPROM
Page 2
Document # EEPROM107 REV OR
DC ELECTRICAL CHARACTERISTICS
(Over Recommended Operating Temperature & Supply Voltage)(2)
Sym Parameter
Value
Unit
V
CC
Power Supply Pin with
Respect to GND
-0.3 to +6.25
V
V
TERM
Terminal Voltage with
Respect to GND (up to
7.0V)
-0.5 to +6.25
V
T
A
Operating Temperature
-55 to +125
°C
T
BIAS
Temperature Under Bias
-55 to +125
°C
T
STG
Storage Temperature
-65 to +150
°C
P
T
Power Dissipation
1.0
W
I
OUT
DC Output Current
50
mA
MAxIMUM RATIngS(1)
RECOMMEnDED OPERATIng COnDITIOnS
grade(2)
Ambient Temp
gnD
V
CC
Military
-55°C to +125°C
0V
5.0V ± 10%
CAPACITAnCES(4)
(V
CC = 5.0V, TA = 25°C, f = 1.0MHz)
Sym
Parameter
Conditions Typ Unit
C
IN
Input Capacitance
V
IN = 0V
10
pF
C
OUT
Output Capacitance
V
OUT = 0V
10
pF
Sym Parameter
Test Conditions
Min
Max
Unit
V
IH
Input High Voltage
2.0
V
CC + 0.5
V
V
IL
Input Low Voltage
-0.5(3)
0.8
V
V
HC
CMOS Input High Voltage
V
CC - 0.2
V
CC + 0.5
V
V
LC
CMOS Input Low Voltage
-0.5(3)
0.2
V
V
OL
Output Low Voltage (TTL Load)
I
OL = +5 mA, VCC = Min
0.4
V
V
OH
Output High Voltage (TTL Load)
I
OH = -5 mA, VCC = Min
2.4
V
I
LI
Input Leakage Current
V
CC = Max
V
IN = GND to VCC
-10
+10
µA
I
LO
Output Leakage Current
V
CC = Max, CE = VIH,
V
OUT = GND to VCC
-10
+10
µA
I
SB
Standby Power Supply Current (TTL Input Levels)
CE ≥ V
IH, OE = VIL,
V
CC = Max,
f = Max, Outputs Open
3
mA
I
SB1
Standby Power Supply Current (CMOS Input Levels)
CE ≥ V
HC,
V
CC = Max,
f = Max, Outputs Open,
V
IN ≤ VLC or VIN ≥ VHC
250
µA
I
CC
Supply Current
CE = OE = V
IL,
WE = V
IH,
All I/O's = Open,
Inputs = V
CC = 5.5V
40
µA
notes:
1. Stresses greater than those listed under MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification
is not implied. Exposure to MAXIMUM rating conditions for extended
periods may affect reliability.
2. Extended temperature operation guaranteed with 400 linear feet per
minute of air flow.
3.TransientinputswithV
IL and IIL not more negative than -3.0V and -100mA,
respectively, are permissible for pulse widths up to 20ns.
4. This parameter is sampled and not 100% tested.



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