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JH395320480DCNFMNFZCWC データシート(PDF) 13 Page - Jewel Hill Electronic

部品番号 JH395320480DCNFMNFZCWC
部品情報  SPECIFICATIONS FOR LCD MODULE
PDF  23 Pages
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メーカー  JHE [Jewel Hill Electronic]
ホームページ  http://www.jhlcd.com
Logo JHE - Jewel Hill Electronic

JH395320480DCNFMNFZCWC データシート(HTML) 13 Page - Jewel Hill Electronic

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JH395320480D
VER: 1.0
- 12 -
Issue date: 2013/08/15
JEWEL HILL ELECTRONIC CO.,LTD.
(VCC=1.65~3.1 V)
10.Reliability and Inspection Standard
No.
Test Item
Test Conditions
Remark
Storage
80℃, 120Hr
Note
1
High Temperature
Operation
70℃, 120Hr
Note
Storage
-30℃, 120Hr
2
Low Temperature
Operation
-20℃, 120Hr
Note
3
High Temperature and High
Humidity
60℃, 90%RH, 120Hr
Note
Storage
-10℃(1Hr) 25℃(5min) 60℃(1Hr)
32 Cycles
4
Temperature Cycle
Operation
-20℃(1Hr) 25℃(5min) 60℃(1Hr)
25 Cycles
Note
5
Peeling Off (Storage)
500gf/cm
Note
6
FPC Bending Test
6,000 times, 2/sec
Note
7
Vibration Test(Storage)
50HZ, 30min,
Amplitude: 2 cm, X/Y/Z directions
Note
8
Drop Test
60cm/ 3Corner/ 8Face, 1Cycle
Note
Note:
1) The test samples should be applied to only one test item.
2) Sample size for each test item is 5~10pcs.
3) For Damp Proof Test, pure water(Resistance>1MΩ) should be used.
4) In case of malfunction defect caused by ESD damage, if it would be recovered to
normal state after resetting, it would be judged as a good part.
5) EL evaluation should be excepted from reliability test with humidity and temperature:
Some defects such as black spot/blemish can happen by natural chemical reaction
with humidity and fluorescence EL has.
6) After the reliability test, the test samples should be inspected after 2 hours at least.
7) Functional test is OK. Missing segment, shorts, unclear segment, non display,
display abnormally, liquid crystal leak are not allowed.
8) After testing, the current Idd should be within initial value ±20%.
9) No low temperature bubbles ,end seal loose and fall, frame rainbow, ACF bubble
growing are allowable in the appearance test.
11.Inspection Criterion



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