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UT699CEC データシート(PDF) 25 Page - Aeroflex Circuit Technology

部品番号 UT699CEC
部品情報  UT699 32-bit Fault-Tolerant SPARCTM V8/LEON 3FT Processor
PDF  41 Pages
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UT699CEC データシート(HTML) 25 Page - Aeroflex Circuit Technology

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The UT699 will begin fetching code from external memory no more than tRESET2 clock cycles after RESET is de-asserted. Control
signals ROMS[0] and OE will be driven to their valid-active states in order for the UT699 to begin fetching code from PROM.
During normal operation, the indicated bus control signals will go to a valid-inactive state, and the bi-directs will go to a high-Z
state, within tRESET3 clock cycles after the assertion of RESET.
4.1.4 Programming Pins GPIO[2:0]
Data on pins GPIO[2:0] are latched on the rising edge of reset. The states of these pins determine the data width of the PROM area,
and enable EDAC for the PROM area. Chapter 3 of the User’s Manual describes the value of these inputs to achieve the required
operation.
In order for the state of GPIO[2:0] to be properly latched, it is recommended to place pull-up or pull-down resistors on these pins to
ensure that the setup and hold timing is met. The states of these pins should be statically set prior to the rising edge of RESET.
4.2 Output Timing Characteristics for Memory Interface, ERROR, and WDOG
(VDD = 3.3V + 0.3V; VDDC = 2.5V + 0.2V; TC = -40
oC to 105oC)
Notes:
1. All outputs are measured using the load conditions shown in Figure 15.
2. High-Z defined as +/-300mV change from steady state.
Symbol
Description
Min
Max
Units
t11
SDCLKto output valid
(ADDR[27:0], WRITE, OE, IOS, ROMS[1:0], RWE [3:0], RAMOE
[4:0], RAMS[4:0], READ, SDRAS, SDCAS, SDWE, SDCS[1:0], and
SDDQM[3:0])
28
ns
t21
SDCLKto output valid
(DATA[31:0] and CB[7:0])
28
ns
t31,2
SDCLKto output high-Z
(DATA[31:0] and CB[7:0])
28
ns
t41
SDCLKto signal low
(ERROR and WDOG)
29
ns
t81,2
WRITEor RWE[3:0]to output high-Z
(DATA [31:0] and CB[7:0])
2.5
-
ns
t91
Skew from first memory output signal transition to last memory output
signal transition
-2
ns



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