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CD4002M データシート(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 CD4002M
部品情報  Dual 4-Input NOR(NAND) Gate
PDF  6 Pages
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

CD4002M データシート(HTML) 4 Page - National Semiconductor (TI)

  CD4002M Datasheet HTML 1Page - National Semiconductor (TI) CD4002M Datasheet HTML 2Page - National Semiconductor (TI) CD4002M Datasheet HTML 3Page - National Semiconductor (TI) CD4002M Datasheet HTML 4Page - National Semiconductor (TI) CD4002M Datasheet HTML 5Page - National Semiconductor (TI) CD4002M Datasheet HTML 6Page - National Semiconductor (TI)  
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AC Electrical Characteristics TA e 25 C CL e 15 pF and input rise and fall times e 20 ns Typical
temperature coefficient for all values of VDD e 03% C
Symbol
Parameter
Conditions
Min
Typ
Max
Units
CD4002M
tPHL
Propagation Delay Time
VDD e 50V
35
50
ns
High to Low Level
VDD e 10V
25
40
ns
tPLH
Propagation Delay Time
VDD e 50V
35
50
ns
Low to High Level
VDD e 10V
25
40
ns
tTHL
Transition Time High
VDD e 50V
65
175
ns
to Low Level
VDD e 10V
35
75
ns
tTLH
Transition Time Low
VDD e 50V
65
125
ns
to High Level
VDD e 10V
35
70
ns
CIN
Input Capacitance
Any Input
50
pF
CD4002C
tPHL
Propagation Delay Time
VDD e 50V
35
120
ns
High to Low Level
VDD e 10V
25
65
ns
TPLH
Propagation Delay Time
VDD e 50V
35
80
ns
Low to High Level
VDD e 10V
25
55
ns
tTHL
Transition Time High
VDD e 50V
65
300
ns
to Low Level
VDD e 10V
35
125
ns
tTLH
Transition Time Low
VDD e 50V
65
200
ns
to High Level
VDD e 10V
35
115
ns
CIN
Input Capacitance
Any Input
50
pF
AC Parameters are guaranteed by DC correlated testing
AC Electrical Characteristics TA e 25 C CL e 15 pF and input rise and fall times e 20 ns Typical
temperature coefficient for all values of VDD e 03% C
Symbol
Parameter
Conditions
Min
Typ
Max
Units
CD4012M
tPHL
Propagation Delay Time
VDD e 50V
50
75
ns
High to Low Level
VDD e 10V
25
40
ns
tPLH
Propagation Delay Time
VDD e 50V
50
75
ns
Low to High Level
VDD e 10V
25
40
ns
tTHL
Transition Time High
VDD e 50V
75
125
ns
to Low Level
VDD e 10V
50
75
ns
tTLH
Transition Time Low
VDD e 50V
75
100
ns
to High Level
VDD e 10V
40
60
ns
CIN
Input Capacitance
Any Input
50
pF
CD4012C
tPHL
Propagation Delay Time
VDD e 50V
50
100
ns
High to Low Level
VDD e 10V
25
50
ns
TPLH
Propagation Delay Time
VDD e 50V
50
100
ns
Low to High Level
VDD e 10V
25
50
ns
tTHL
Transition Time High
VDD e 50V
75
150
ns
to Low Level
VDD e 10V
50
100
ns
tTLH
Transition Time Low
VDD e 50V
75
125
ns
to High Level
VDD e 10V
40
75
ns
CIN
Input Capacitance
Any Input
50
pF
AC Parameters are guaranteed by DC correlated testing
Note 1
‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed Except for ‘‘Operating Temperature
Range’’ they are not meant to imply that the devices should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual
device operation
4



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