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DMN2009LSS データシート(PDF) 2 Page - Diodes Incorporated |
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DMN2009LSS データシート(HTML) 2 Page - Diodes Incorporated |
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2 / 5 page ![]() DMN2009LSS Document number: DS31409 Rev. 7 - 2 2 of 5 www.diodes.com October 2013 © Diodes Incorporated DMN2009LSS Maximum Ratings (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Value Units Drain-Source Voltage VDSS 20 V Gate-Source Voltage VGSS 12 V Drain Current (Note 5) Steady State TA = +25°C TA = +70°C ID 12 9.6 A Pulsed Drain Current (Note 6) IDM 42 A Thermal Characteristics Characteristic Symbol Value Unit Total Power Dissipation (Note 5) PD 2 W Thermal Resistance, Junction to Ambient RJA 62.5 °C/W Operating and Storage Temperature Range TJ, TSTG -55 to +150 °C Electrical Characteristics (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Min Typ Max Unit Test Condition OFF CHARACTERISTICS (Note 7) Drain-Source Breakdown Voltage BVDSS 20 V VGS = 0V, ID = 250μA Zero Gate Voltage Drain Current IDSS 1 μA VDS = 20V, VGS = 0V Gate-Source Leakage IGSS 100 nA VGS = 12V, VDS = 0V ON CHARACTERISTICS (Note 7) Gate Threshold Voltage VGS(th) 0.5 1.2 V VDS = VGS, ID = 250μA Static Drain-Source On-Resistance RDS (ON) 8 9 12 mΩ VGS = 10V, ID = 12A VGS = 4.5V, ID = 10A VGS = 2.5V, ID = 8A Forward Transconductance gfs 27 S VDS = 5V, ID = 6.5A Diode Forward Voltage VSD 0.5 0.7 1.2 V VGS = 0V, IS = 3A DYNAMIC CHARACTERISTICS (Note 8) Input Capacitance Ciss 2555 pF VDS = 10V, VGS = 0V, f = 1.0MHz Output Capacitance Coss 523 pF Reverse Transfer Capacitance Crss 496 pF Gate Resistance RG 1.1 Ω VGS = 0V VDS = 0V, f = 1MHz SWITCHING CHARACTERISTICS (Note 8) Total Gate Charge Qg 28.9 58.3 nC VDS = 10V, VGS = 4.5V, ID = 12A VDS = 10V, VGS = 10V, ID = 12A Gate-Source Charge Qgs 3.7 VDS = 10V, VGS = 10V, ID = 12A Gate-Drain Charge Qgd 11.4 VDS = 10V, VGS = 10V, ID = 12A Notes: 5. Device mounted on 2 oz, FR-4 PCB, with RJA = 62.5°C/W 6. Pulse width 10μS, Duty Cycle 1%. 7. Short duration pulse test used to minimize self-heating effect. 8. Guaranteed by design. Not subject to product testing. |
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