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DF2B18FU データシート(PDF) 2 Page - Toshiba Semiconductor

部品番号 DF2B18FU
部品情報  ESD Protection Diodes Silicon Epitaxial Planar
PDF  9 Pages
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メーカー  TOSHIBA [Toshiba Semiconductor]
ホームページ  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

DF2B18FU データシート(HTML) 2 Page - Toshiba Semiconductor

  DF2B18FU Datasheet HTML 1Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 2Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 3Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 4Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 5Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 6Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 7Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 8Page - Toshiba Semiconductor DF2B18FU Datasheet HTML 9Page - Toshiba Semiconductor  
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DF2B18FU
2
4.
4.
4.
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25
))))
Characteristics
Electrostatic discharge voltage (IEC61000-4-2)(Contact)
Electrostatic discharge voltage(IEC61000-4-2)(Air)
Electrostatic discharge voltage(ISO10605)(Contact)
Electrostatic discharge voltage(ISO10605)(Air)
Peak pulse power
Peak pulse current
Junction temperature
Storage temperature
Symbol
VESD
VESD
PPK
IPP
Tj
Tstg
Note
(Note 1)
(Note 2)
(Note 3)
Rating
±30
±30
80
2.5
150
-55 to 150
Unit
kV
kV
W
A
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: According to IEC61000-4-2.
Note 2: According to ISO10605. (@ C = 330 pF, R = 2 kΩ)
Note 3: According to IEC61000-4-5.
2015-05-13
Rev.1.0



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