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ADC12L034CIWM データシート(PDF) 9 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 ADC12L034CIWM
部品情報  3.3V Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with MUX and Sample/Hold
PDF  36 Pages
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC12L034CIWM データシート(HTML) 9 Page - National Semiconductor (TI)

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AC Electrical Characteristics (Continued)
The following specifications apply for V
+ = V
A+ = VD+ = +3.3 VDC,VREF+ = +2.500 VDC,VREF− = 0VDC, 12-bit + sign conver-
sion mode, t
r = tf = 3 ns, fCK = fSK = 5 MHz, RS = 25Ω, source impedance for VREF+ and VREF− ≤ 25Ω, fully-differential input
with fixed 1.250V common-mode voltage, and 10(t
CK) acquisition time unless otherwise specified. Boldface limits apply for TA
= T
J = TMIN to TMAX; all other limits TA = TJ = 25˚C. (Note 17)
Symbol
Parameter
Conditions
Typical
Limits
Units
(Note 10)
(Note 11)
(Limits)
t
SPU
Software Power-Up Time, Time from
500
700
µs (max)
Serial Data Clock Falling Edge to
EOC Rising Edge
t
ACC
Access Time Delay from
25
60
ns (max)
CS Falling Edge to DO Data Valid
t
SET-UP
Set-Up Time of CS Falling Edge to
50
ns (min)
Serial Data Clock Rising Edge
t
DELAY
Delay from SCLK Falling
0
5
ns (min)
Edge to CS Falling Edge
t
1H,t0H
Delay from CS Rising Edge to
R
L = 3k, CL = 100 pF
70
100
ns (max)
DO TRI-STATE
t
HDI
DI Hold Time from Serial Data
5
15
ns (min)
Clock Rising Edge
t
SDI
DI Set-Up Time from Serial Data
5
10
ns (min)
Clock Rising Edge
t
HDO
DO Hold Time from Serial Data
R
L = 3k, CL = 100 pF
35
65
ns (max)
Clock Falling Edge
5
ns (min)
t
DDO
Delay from Serial Data Clock
50
90
ns (max)
Falling Edge to DO Data Valid
t
RDO
DO Rise Time, TRI-STATE to High
R
L = 3k, CL = 100 pF
10
40
ns (max)
DO Rise Time, Low to High
10
40
ns (max)
t
FDO
DO Fall Time, TRI-STATE to Low
R
L = 3k, CL = 100 pF
15
40
ns (max)
DO Fall Time, High to Low
15
40
ns (max)
t
CD
Delay from CS Falling Edge
50
80
ns (max)
to DOR Falling Edge
t
SD
Delay from Serial Data Clock Falling
45
80
ns (max)
Edge to DOR Rising Edge
C
IN
Capacitance of Logic Inputs
10
pF
C
OUT
Capacitance of Logic Outputs
20
pF
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-
tional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed speci-
fications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: When the input voltage (VIN) at any pin exceeds the power supplies (VIN < GND or VIN > VA+orVD+), the current at that pin should be limited to 20 mA.
The 120 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 20 mA to four.
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax, θJA and the ambient temperature, TA. The maximum
allowable power dissipation at any temperature is PD = (TJmax − TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. For this device,
TJ max = 150˚C. The typical thermal resistance (θJA) of these parts when board mounted follow:
www.national.com
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