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CLC007 データシート(PDF) 5 Page - National Semiconductor (TI) |
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CLC007 データシート(HTML) 5 Page - National Semiconductor (TI) |
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5 / 10 page ![]() Operation (Continued) when driving 10K ECL. Noise margins will not be affected when interfacing to F100K since F100K is fully voltage and temperature compensated. OUTPUT RISE AND FALL TIMES Output load capacitance can significantly affect output rise and fall times. The effect of load capacitance, stray or other- wise, may be reduced by placing the output back-match re- sistor close to the output pin and by minimizing all intercon- necting trace lengths. Figure 8 shows the effect on risetime of parallel load capacitance across a 150 Ω load. DS100085-9 FIGURE 6. Output Stage DS100085-10 FIGURE 7. Differential Input DC Coupled Output www.national.com 5 |
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