BFC51 datasheet(2/2 Pages) SEME-LAB

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BFC51

Characteristic

Test Conditions

Min.

Typ.

Max. Unit

Ciss

Coss

Crss

Qgs

Qgd

td(on)

td(off)

Characteristic

Test Conditions

Min.

Typ.

Max. Unit

1.3

148

296

592

2.2

4.4

8.8

Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.

Prelim. 4/94

ISM

VSD

trr

Qrr

(Body Diode)

VGS = 0V , IS = – ID [Cont.]

IS = – ID [Cont.] , dls / dt = 100A/µs

Continuous Source Current

Pulsed Source Current1

Diode Forward Voltage2

Reverse Recovery Time

Reverse Recovery Charge

µC

Characteristic

Test Conditions

Min.

Typ.

Max. Unit

240

SOA1

SOA2

ILM

Safe Operating Area

Inductive Current Clamped

Characteristic

Min.

Typ.

Max. Unit

0.51

RθJC

RθJA

Junction to Case

Junction to Ambient

°C/W

DYNAMIC CHARACTERISTICS

SOURCE – DRAIN DIODE RATINGS AND CHARACTERISTICS

SAFE OPERATING AREA CHARACTERISTICS

THERMAL CHARACTERISTICS

1) Repetitive Rating: Pulse Width limited by maximum junction temperature.

2) Pulse Test: Pulse Width < 380

µS , Duty Cycle < 2%

3) See MIL–STD–750 Method 3471

Input Capacitance

Output Capacitance

Reverse Transfer Capacitance

Total Gate Charge3

Gate – Source Charge

Gate – Drain (“Miller”) Charge

Turn–on Delay Time

Rise Time

Turn-off Delay Time

Fall Time

VGS = 0V

VDS = 25V

f = 1MHz

VGS = 10V

VDD = 0.5 VDSS

ID = ID [Cont.] @ 25°C

VGS = 15V

VDD = 0.5 VDSS

ID = ID [Cont.] @ 25°C

RG = 1.8Ω

1430

1800

330

465

130

200

105

8.7

LAB

SEME

CAUTION — Electrostatic Sensitive Devices. Anti-Static Procedures Must Be Followed.

VDS = 0.4VDSS , t = 1 Sec.

IDS = PD / 0.4VDSS

VDS = PD / ID [Cont.]

IDS = ID [Cont.] , t = 1 Sec.

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