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LM8364 データシート(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
部品番号 LM8364
部品情報  Micropower Undervoltage Sensing Circuits
PDF  8 Pages
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM8364 データシート(HTML) 3 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage
−0.3V to 6.5V
RESET Output Voltage
−0.3V to 6.5V
RESET Output Current
70mA
Storage Temperature Range
−65˚C to 150˚C
Mounting Temp.
Lead temp (Soldering, 10 sec)
260˚C
Junction Temperature
125˚
Operating Ratings (Note 1)
Temperature Range
−40˚C to 85˚C
Thermal Resistance to ambient (
θ
JA)
265˚C/W
ESD Tolerance
Human Body Model
2000V
Machine Model
200V
Electrical Characteristics
Unless otherwise specified, all limits guaranteed for T
A = 25˚C.
Symbol
Parameter
Conditions
Min
(Note 3)
Typ
(Note 2)
Max
(Note 3)
Units
V
DET−
Detector Threshold Voltage
High to Low State Output
(V
IN Decreasing)
V
20 Suffix
1.950
2.0
2.050
30 Suffix
2.925
3.0
3.075
45 Suffix
4.388
4.5
4.613
V
HYS
Detector Threshold
Hysteresis
V
IN Increasing
V
20 Suffix
0.060
0.100
0.140
30 Suffix
0.090
0.150
0.210
45 Suffix
0.135
0.225
0.315
∆Vdet/∆T
Detector Threshold Voltage
Temperature Coefficient
±100
PPM/˚C
V
OL
RESET Output Voltage Low
State
(Open Drain Output: I
SINK = 1mA)
0.25
0.5
V
I
OL
RESET Output Sink Current
V
IN = 1.5V, VOL = 0.5V
1.0
2.5
mA
V
IN
Operating Input Voltage
Range
1.0
6.0
V
I
IN
Quiescent Input Current
20 Suffix
µA
V
IN = 1.9V
0.55
0.8
V
IN = 4.0V
0.70
1.3
30 Suffix
V
IN = 2.87V
0.65
0.9
V
IN = 5.0V
0.77
1.3
45 Suffix
V
IN = 4.34V
0.70
1.0
V
IN = 6.0
0.85
1.4
t
p
Propagation Delay Time
Figure 1
60
300
µs
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.
Note 2: Typical values represent the most likely parametric norm
Note 3: All limits are guaranteed by testing or statistical analysis.
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