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ACT00M データシート(PDF) 2 Page - Texas Instruments

部品番号 ACT00M
部品情報  QUADRUPLE 2-INPUT POSITIVE-NAND GATES
PDF  5 Pages
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メーカー  TI [Texas Instruments]
ホームページ  http://www.ti.com
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ACT00M データシート(HTML) 2 Page - Texas Instruments

  ACT00M Datasheet HTML 1Page - Texas Instruments ACT00M Datasheet HTML 2Page - Texas Instruments ACT00M Datasheet HTML 3Page - Texas Instruments ACT00M Datasheet HTML 4Page - Texas Instruments ACT00M Datasheet HTML 5Page - Texas Instruments  
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CD54ACT00, CD74ACT00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SCHS308B – JANUARY 2001 – REVISED JUNE 2002
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC
–0.5 V to 6 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1)
±20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1)
±50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, IO (VO = 0 to VCC)
±50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through VCC or GND
±100 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance,
θJA (see Note 2): E package
80
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
M package
86
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg
–65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
recommended operating conditions (see Note 3)
TA = 25°C
–40
°C TO
85
°C
–55
°C TO
125
°C
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
VCC
Supply voltage
4.5
5.5
4.5
5.5
4.5
5.5
V
VIH
High-level input voltage
2
2
2
V
VIL
Low-level input voltage
0.8
0.8
0.8
V
VI
Input voltage
0
VCC
0
VCC
0
VCC
V
VO
Output voltage
0
VCC
0
VCC
0
VCC
V
IOH
High-level output current
–24
–24
–24
mA
IOL
Low-level output current
24
24
24
mA
∆t/∆v Input transition rise or fall rate
10
10
10
ns/V
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
TA = 25°C
–40
°C TO
85
°C
–55
°C TO
125
°C
UNIT
CC
MIN
MAX
MIN
MAX
MIN
MAX
IOH = –50 µA
4.5 V
4.4
4.4
4.4
VOH
VI =VIH or VIL
IOH = –24 mA
4.5 V
3.94
3.8
3.7
V
VOH
VI = VIH or VIL
IOH = –50 mA‡
5.5 V
3.85
V
IOH = –75 mA‡
5.5 V
3.85
IOL = 50 µA
4.5 V
0.1
0.1
0.1
VOL
VI =VIH or VIL
IOL = 24 mA
4.5 V
0.36
0.44
0.5
V
VOL
VI = VIH or VIL
IOL = 50 mA‡
5.5 V
1.65
V
IOL = 75 mA‡
5.5 V
1.65
II
VI = VCC or GND
5.5 V
±0.1
±1
±1
µA
ICC
VI = VCC or GND,
IO = 0
5.5 V
4
40
80
µA
∆ICC
VI = VCC – 2.1 V
4.5 V to 5.5 V
2.4
2.8
3
mA
Ci
10
10
10
pF
‡ Test one output at a time, not exceeding 1-second duration. Measurement is made by forcing indicated current and measuring voltage to minimize
power dissipation. Test verifies a minimum 50-
Ω transmission-line drive capability at 85°C and 75-Ω transmission-line drive capability at 125°C.



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