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FT311D-32L1C-R データシート(PDF) 21 Page - Future Technology Devices International Ltd. |
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FT311D-32L1C-R データシート(HTML) 21 Page - Future Technology Devices International Ltd. |
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21 / 40 page ![]() Copyright © 2013 Future Technology Devices International Limited 21 DS_FT311D USB ANDROID HOST IC Datasheet Version 1.2 Document No.: FT_000660 Clearance No.: FTDI# 305 7 Absolute Maximum Ratings The absolute maximum ratings for FT311D are shown in Table 7.1. These are in accordance with the Absolute Maximum Rating System (IEC 60134). Exceeding these may cause permanent damage to the device. Parameter Value Unit Storage Temperature -65°C to 150°C Degrees C Floor Life (Out of Bag) At Factory Ambient ( 30°C / 60% Relative Humidity) 168 Hours (IPC/JEDEC J-STD-033A MSL Level 3 Compliant)* Hours Ambient Temperature (Power Applied) -40°C to 85°C Degrees C. Vcc Supply Voltage 0 to +3.63 V VCC_IO 0 to +3.63 V VCC_PLL_IN 0 to + 1.98 V DC Input Voltage - USBDP and USBDM -0.5 to +(Vcc +0.5) V DC Input Voltage - High Impedance Bidirectional -0.5 to +5.00 V DC Input Voltage - All other Inputs -0.5 to +(Vcc +0.5) V DC Output Current - Outputs 4 mA DC Output Current - Low Impedance Bidirectional 4 mA Table 7.1 Absolute Maximum Ratings * If devices are stored out of the packaging beyond this time limit the devices should be baked before use. The devices should be ramped up to a temperature of 125°C and baked for up to 17 hours. |
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