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L9659 データシート(PDF) 27 Page - STMicroelectronics |
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L9659 データシート(HTML) 27 Page - STMicroelectronics |
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27 / 51 page  L9659 Functional description Doc ID 022048 Rev 2 27/51 3.4.4 Squib diagnostics Overview The ASIC is able to perform the following diagnostics ● Short to battery and ground on both SQHx and SQLx pins with or without a squib ● Loop to loop diagnostics ● Squib resistance measurement ● Squib High resistance ● High side safing FET diagnostics ● VRESx voltage status ● High and low side FET diagnostics Below is a block diagram showing the components involved in the squib diagnostics. Figure 9. Squib diagnostics block diagram Short to battery/ground and loop to loop diagnostics The leakage diagnostic includes a short to battery, a short to ground and a short between loop tests. The test will be run for each SQHx and SQLx pin so that shorts can be detected regardless of the resistance between the squib pins. Normal short to battery/ground diagnostics. For the test the internal VRCM is switched on and connected to the selected pin (SQHx or SQLx) pin. The IPD bit will be selected to be OFF which will deactivate the pulldown current |
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