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STM32F100RC データシート(PDF) 85 Page - STMicroelectronics

部品番号 STM32F100RC
部品情報  Clock, reset and supply management
PDF  106 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F100RC データシート(HTML) 85 Page - STMicroelectronics

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STM32F100xC, STM32F100xD, STM32F100xE
Electrical characteristics
105
Note:
ADC accuracy vs. negative injection current: Injecting a negative current on any analog
input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to
ground) to analog pins which may potentially inject negative currents.
Table 52. RAIN max for fADC = 12 MHz(1)
1. Guaranteed by design, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (kΩ)
1.5
0.125
0.4
7.5
0.625
5.9
13.5
1.125
11.4
28.5
2.375
25.2
41.5
3.45
37.2
55.5
4.625
50
71.5
5.96
NA
239.5
20
NA
Table 53. ADC accuracy - limited test conditions(1)(2)
1. ADC DC accuracy values are measured after internal calibration.
2. Preliminary values.
Symbol
Parameter
Test conditions
Typ
Max
Unit
ET
Total unadjusted error
fPCLK2 = 24 MHz,
fADC = 12 MHz, RAIN < 10 kΩ,
VDDA = 3 V to 3.6 V
VREF+ = VDDA
TA = 25 °C
Measurements made after
ADC calibration
±1.5
±2.5
LSB
EO
Offset error
±1
±2
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±1.5
±2
EL
Integral linearity error
±1.5
±2
Table 54. ADC accuracy(1) (2) (3)
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges.
3. Preliminary values.
Symbol
Parameter
Test conditions
Typ
Max
Unit
ET
Total unadjusted error
fPCLK2 = 24 MHz,
fADC = 12 MHz, RAIN < 10 kΩ,
VDDA = 2.4 V to 3.6 V
TA = Full operating range
Measurements made after
ADC calibration
±2
±5
LSB
EO
Offset error
±1.5
±2.5
EG
Gain error
±1.5
±3
ED
Differential linearity error
±1.5
±2.5
EL
Integral linearity error
±1.5
±4.5



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