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データシートサーチシステム |
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TP3070 データシート(PDF) 12 Page - National Semiconductor (TI) |
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TP3070 データシート(HTML) 12 Page - National Semiconductor (TI) |
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12 / 26 page  Electrical Characteristics (Continued) Unless otherwise noted, limits printed in BOLD characters are guaranteed for V CC = +5V ±5%,VBB = −5V ±5%;TA = 0˚C to +70˚C (−40˚C to +85˚C for TP3070-X) by correlation with 100% electrical testing at T A = 25˚C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at V CC = +5V, VBB = −5V, TA = 25˚C. Symbol Parameter Conditions Min Typ Max Units POWER DISSIPATION I BB1 Power Up Current As Above −8.0 −11.0 mA −40˚C to +85˚C (TP3070-X) −13.0 mA I CC2 Power Down Current Power Amp Enabled 2.0 3.0 mA −40˚C to +85˚C (TP3070-X) 4.0 mA I BB2 Power Down Current Power Amp Enabled −2.0 −3.0 mA −40˚C to +85˚C (TP3070-X) −4.0 mA Note 9: “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. Note 10: See definitions and timing conventions section. Timing Specifications Unless otherwise noted, limits printed in BOLD characters are guaranteed for V CC = +5V ±5%;VBB = −5V ±5%;TA = 0˚C to +70˚C (−40˚C to +85˚C for TP3070-X) by correlation with 100% electrical testing at T A = 25˚C. All other limits are assured by correlation with other production tests and/or product design and characterization. All signals referenced to GND. Typicals specified at V CC = +5V, VBB = −5V, TA = 25˚C. All timing parameters are measured at V OH = 2.0V and VOL = 0.7V. See Definitions and Timing Conventions section for test methods information. Symbol Parameter Conditions Min Typ Max Units MASTER CLOCK TIMING f MCLK Frequency of MCLK Selection of Frequency is 512 kHz Programmable (See Table 5) 1536 kHz 1544 kHz 2048 kHz 4096 kHz t WMH Period of MCLK High Measured from V IH to VIH (Note 11) 80 ns t WML Period of MCLK Low Measured from V IL to VIL (Note 11) 80 ns t RM Rise Time of MCLK Measured from V IL to VIH 30 ns t FM Fall Time of MCLK Measured from V IH to VIL 30 ns t HBM HOLD Time, BCLK LOW TP3070 Only 50 ns to MCLK HIGH t WFL Period of F SX or FSR Low Measured from V IL to VIL 1 MCLK Period PCM INTERFACE TIMING f BCLK Frequency of BCLK May Vary from 64 kHz to 4096 kHz 64 4096 kHz in 8 kHz Increments t WBH Period of BCLK High Measured from V IH to VIH 80 ns t WBL Period of BCLK Low Measured from V IL to VIL 80 ns t RB Rise Time of BCLK Measured from V IL to VIH 30 ns t FB Fall Time of BCLK Measured from V IH to VIL 30 ns t HBF Hold Time, BCLK Low 30 ns to FS X/R High or Low t SFB Setup Time, FS X/R 30 ns High to BCLK Low t DBD Delay Time, BCLK High Load = 100 pF Plus 2 LSTTL Loads 80 ns to Data Valid −40˚C to +85˚C (TP3070-X) 90 ns www.national.com 12 |
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