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AM29F010B データシート(PDF) 29 Page - SPANSION

部品番号 AM29F010B
部品情報  1 Megabit (128 K x 8-bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
PDF  35 Pages
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AM29F010B データシート(HTML) 29 Page - SPANSION

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Am29F010B
November 18, 2002
AC CHARACTERISTICS
ERASE AND PROGRAMMING PERFORMANCE
Notes:
1. Typical program and erase times assume the following conditions: 25
°C, 5.0 V V
CC, 1 million cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 4.5 V (4.75 V for -45), 100,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then
does the device set DQ5 = 1. See the section on DQ5 for further information.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See Table 4
for further information on command definitions.
6. The device has a minimum guaranteed erase cycle endurance of 1 million cycles.
tGHEL
tWS
OE#
CE#
WE#
tDS
Data
tAH
Addresses
tDH
tCP
DQ7#
DOUT
tWC
tAS
tCPH
PA
Data# Polling
A0 for program
55 for erase
tWHWH1 or 2
tWH
PD for program
30 for sector erase
10 for chip erase
555 for program
2AA for erase
PA for program
SA for sector erase
555 for chip erase
Notes:
1. PA = Program Address, PD = Program Data, SA = Sector Address, DQ7# = Complement of Data Input, DOUT = Array Data.
2. Figure indicates the last two bus cycles of the command sequence.
Figure 13.
Alternate CE# Controlled Write Operation Timings
Parameter
Limits
Comments
Typ (Note 1)
Max (Note 2)
Unit
Chip/Sector Erase Time
1.0
15
sec
Excludes 00h programming prior to
erasure (Note 4)
Byte Programming Time
7
300
µs
Excludes system-level overhead
(Note 5)
Chip Programming Time (Note 3)
0.9
6.25
sec



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