TSV712IST datasheet(18/29 Pages) STMICROELECTRONICS

部品番号	TSV712IST

部品情報	EMI hardened operational amplifiers

PDF	29 Pages

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メーカー	STMICROELECTRONICS [STMicroelectronics]

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18 / 29 page

Application information

TSV711, TSV712, TSV714

18/29

DocID023707 Rev 2

Equation 5

To evaluate the op-amp reliability, a follower stress condition is used where VCC is defined

as a function of the maximum operating voltage and the absolute maximum rating (as

recommended by JEDEC rules).

The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at

different measurement conditions (see Equation 6).

Equation 6

The long term drift parameter (ΔVio), estimating the reliability performance of the product, is

obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the

calculated number of months (Equation 7).

Equation 7

where Vio drift is the measured drift value in the specified test conditions after 1000 h stress

duration.

Months

AF 1000 h

12 months

24 h

365.25 days

()

⁄

VCC

maxVop with Vicm

VCC 2

⁄

ΔVio

Viodrift

months

()

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TSV712IST データシート(PDF) 18 Page - STMicroelectronics