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STV7620F データシート(PDF) 15 Page - STMicroelectronics |
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STV7620F データシート(HTML) 15 Page - STMicroelectronics |
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15 / 16 page ![]() STV7620S/M/F 15/16 Figure 3. Zoom for OUTn showing tS and tF OUT Figure 4. Test configuration 11 TESTED WAFER DISCLAIMER All wafers are tested and guaranteed to comply with all datasheet limits up to the point of wafer sawing for a period of ninety (90) days from the delivery date. We remind you that it is the customer’s responsibility to test and qualify their application in which the die is used. ST Microelectronics is ready to support the customer when qualifying the product. OUTn 90% 10% tS tF OUT VDOUTH IDOUTH VSSP VDOUTL IDOUTL VSSP VPP=VSSP VPP=VSSP Output sinking current as positive value, sourcing current as negative value |
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