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VSC880 データシート(PDF) 3 Page - Vitesse Semiconductor Corporation

部品番号 VSC880
部品情報  High Performance 16x16 Serial Crosspoint Switch
PDF  28 Pages
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メーカー  VITESSE [Vitesse Semiconductor Corporation]
ホームページ  http://www.vitesse.com
Logo VITESSE - Vitesse Semiconductor Corporation

VSC880 データシート(HTML) 3 Page - Vitesse Semiconductor Corporation

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VITESSE
SEMICONDUCTOR CORPORATION
Data Sheet
VSC880
High Performance 16x16
Serial Crosspoint Switch
G52191-0, Rev 4.2
Page 3
01/05/01
© VITESSE SEMICONDUCTOR CORPORATION • 741 Calle Plano • Camarillo, CA 93012
Tel: (800) VITESSE • FAX: (805) 987-5896 • Email: prodinfo@vitesse.com
Internet: www.vitesse.com
RESYNEN
Resynch Enable
I
<1MHz
TTL
If RESYNEN is HIGH, all links that have a link error
condition will be reinitialized. This will override the internal
control register settings.
INT
Interrupt
O
<1MHz
TTL
If INT is LOW, a receive error has occurred in one of the
links that has it’s output enable (OE) bit set HIGH and
interrupt control register bit set HIGH.
MEN
Reserved
I
<1MHz
TTL
This signal is reserved for future use and should be set LOW
during normal operation.
FACLPBK
Facility Loop Back
I
<1MHz
TTL
If this signal is set HIGH, all serial inputs are looped back to
their serial outputs. This will override the internal control
register setting.
CMODE
Cell Mode
I
<1MHz
TTL
CMODE is set HIGH for Cell Mode operation.
TESTEN
Scan Test Enable
I
<1MHz
TTL
This signal is used in ATE testing to measure propagation
delay. It is also used in ATE testing of the BIST logic. Set to
logic LOW in normal operation.
SCANIN
Scan Data In
I
62.5Mb/s
TTL
The input signal for measuring propagation delay on the
ATE tester.
SCANOUT
Scan Data Out
O
62.5Mb/s
TTL
The output signal for measuring propagation delay on the
ATE tester. When TESTEN is set LOW, the longer delay
path is enabled.
WCLK
Word Clock
O
62.5MHz
TTL
This is the word clock output.
REFCLK
Reference Clock
I
62.5MHz
TTL
This is the reference clock and the source of the system wide
word clock period.
TCLKEN
Test Clock Enable
I
<1MHz
TTL
This input is set HIGH in test mode, so that the CMU is
bypassed and the REFCLK becomes the bit clock. This
signal is for ATE test only. Set LOW in normal operation.
CCLK
Cell Clock
I
62.5MHz
TTL
This is the source of the system wide cell clock. It is
internally synchronized to the REFCLK. In Packet mode, set
this signal HIGH to enable external switch configuration for
BIST.
RESET
Reset
I
<1MHz
TTL
Global chip reset (active LOW)
BSTLPBK
Built-in Self Test Loop
Back
I
<1MHz
TTL
When BSTLPBK is set HIGH and TESTEN is LOW, all
serial data output signals are looped back to their serial data
inputs. If BSTLPBK is set HIGH and TESTEN is HIGH,
only ports 0-7 are placed in loopback.
BSTEN
Built-in Self Test Enable
I
<1MHz
TTL
When BSTEN is HIGH, at-speed built-in self testing is
enabled.
BSTRST
Built-in Self Test Reset
I
<1MHz
TTL
The BSTRST signal is set HIGH to reset the PRBS
generator and comparator.
BSTPASS
Built-in Self Test Pass
O
<1MHz
TTL
The BSTPASS signal is HIGH if BTSEN is HIGH and the
PRBS comparator detects the correct pattern in built-in self
test mode.
Pin
Name
I/O
Freq
Type
Description



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