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VSC880 データシート(PDF) 3 Page - Vitesse Semiconductor Corporation |
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VSC880 データシート(HTML) 3 Page - Vitesse Semiconductor Corporation |
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3 / 28 page ![]() VITESSE SEMICONDUCTOR CORPORATION Data Sheet VSC880 High Performance 16x16 Serial Crosspoint Switch G52191-0, Rev 4.2 Page 3 01/05/01 © VITESSE SEMICONDUCTOR CORPORATION • 741 Calle Plano • Camarillo, CA 93012 Tel: (800) VITESSE • FAX: (805) 987-5896 • Email: prodinfo@vitesse.com Internet: www.vitesse.com RESYNEN Resynch Enable I <1MHz TTL If RESYNEN is HIGH, all links that have a link error condition will be reinitialized. This will override the internal control register settings. INT Interrupt O <1MHz TTL If INT is LOW, a receive error has occurred in one of the links that has it’s output enable (OE) bit set HIGH and interrupt control register bit set HIGH. MEN Reserved I <1MHz TTL This signal is reserved for future use and should be set LOW during normal operation. FACLPBK Facility Loop Back I <1MHz TTL If this signal is set HIGH, all serial inputs are looped back to their serial outputs. This will override the internal control register setting. CMODE Cell Mode I <1MHz TTL CMODE is set HIGH for Cell Mode operation. TESTEN Scan Test Enable I <1MHz TTL This signal is used in ATE testing to measure propagation delay. It is also used in ATE testing of the BIST logic. Set to logic LOW in normal operation. SCANIN Scan Data In I 62.5Mb/s TTL The input signal for measuring propagation delay on the ATE tester. SCANOUT Scan Data Out O 62.5Mb/s TTL The output signal for measuring propagation delay on the ATE tester. When TESTEN is set LOW, the longer delay path is enabled. WCLK Word Clock O 62.5MHz TTL This is the word clock output. REFCLK Reference Clock I 62.5MHz TTL This is the reference clock and the source of the system wide word clock period. TCLKEN Test Clock Enable I <1MHz TTL This input is set HIGH in test mode, so that the CMU is bypassed and the REFCLK becomes the bit clock. This signal is for ATE test only. Set LOW in normal operation. CCLK Cell Clock I 62.5MHz TTL This is the source of the system wide cell clock. It is internally synchronized to the REFCLK. In Packet mode, set this signal HIGH to enable external switch configuration for BIST. RESET Reset I <1MHz TTL Global chip reset (active LOW) BSTLPBK Built-in Self Test Loop Back I <1MHz TTL When BSTLPBK is set HIGH and TESTEN is LOW, all serial data output signals are looped back to their serial data inputs. If BSTLPBK is set HIGH and TESTEN is HIGH, only ports 0-7 are placed in loopback. BSTEN Built-in Self Test Enable I <1MHz TTL When BSTEN is HIGH, at-speed built-in self testing is enabled. BSTRST Built-in Self Test Reset I <1MHz TTL The BSTRST signal is set HIGH to reset the PRBS generator and comparator. BSTPASS Built-in Self Test Pass O <1MHz TTL The BSTPASS signal is HIGH if BTSEN is HIGH and the PRBS comparator detects the correct pattern in built-in self test mode. Pin Name I/O Freq Type Description |
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