STR91XF datasheet(21/72 Pages) STMICROELECTRONICS

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STR91xF

Functional overview

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drawn by the RTC unit on the VBATT pin is very low in this standby mode, IRTC_STBY (this

assumes SRAM battery backup is not enabled).

2.15

JTAG interface

An IEEE-1149.1 JTAG interface on the STR91xF provides In-System-Programming (ISP) of all

memory, boundary scan testing of pins, and the capability to debug the CPU.

Six pins are used on this JTAG serial interface. The five signals JTDI, JTDO, JTMS, JTCK, and

JTRSTn are all standard JTAG signals complying with the IEEE-1149.1 specification. The sixth

signal, JRTCK (Return TCK), is an output from the STR91xF and it is used to pace the JTCK

clock signal coming in from the external JTAG test equipment for debugging. The frequency of

the JTCK clock signal coming from the JTAG test equipment must be at least 10 times less than

the ARM966E-S CPU core operating frequency (fCPUCLK). To ensure this, the signal JRTCK is

output from the STR91xF and is input to the external JTAG test equipment to hold off transitions

of JTCK until the CPU core is ready, meaning that the JTAG equipment cannot send the next

rising edge of JTCK until the equipment receives a rising edge of JRTCK from the STR91xF.

The JTAG test equipment must be able to interpret the signal JRTCK and perform this adaptive

clocking function. If it is known that the CPU clock will always be at least ten times faster than

the incoming JTCK clock signal, then the JRTCK signal is not needed.

The two die inside the STR91xF (CPU die and Flash memory die) are internally daisy-chained

on the JTAG bus, see Figure 3 on page 22. The CPU die has two JTAG Test Access Ports

(TAPs), one for boundary scan functions and one for ARM CPU debug. The Flash memory die

has one TAP for program/erase of non-volatile memory. Because these three TAPs are daisy-

chained, only one TAP will converse on the JTAG bus at any given time while the other two

TAPs are in BYPASS mode. The TAP positioning order within this JTAG chain is the boundary

scan TAP first, followed by the ARM debug TAP, followed by the Flash TAP. All three TAP

controllers are reset simultaneously by one of two methods:

●

A chip-level global reset, caused only by a Power-On-Reset (POR) or a Low Voltage

Detect (LVD).

●

A reset command issued by the external JTAG test equipment. This can be the assertion

of the JTAG JTRSTn input pin on the STR91xF or a JTAG reset command shifted into the

STR91xF serially.

This means that chip-level system resets from watchdog time-out or the assertion of

RESET_INn pin do not affect the operation of any JTAG TAP controller. Only global resets

effect the TAPs.

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