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AM29SL400CB100REF データシート(PDF) 28 Page - Advanced Micro Devices |
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AM29SL400CB100REF データシート(HTML) 28 Page - Advanced Micro Devices |
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28 / 44 page ![]() 26 Am29SL400C Am29SL400C_00_A6 January 23, 2007 D A TA SH EE T TEST CONDITIONS Table 7. Test Specifications Key to Switching Waveforms CL Device Under Test Figure 11. Test Setup Test Condition All Speed Options Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.0 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
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