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TUSB2E221 データシート(PDF) 21 Page - Texas Instruments |
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TUSB2E221 データシート(HTML) 21 Page - Texas Instruments |
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21 / 65 page  7 Parametric Measurement Information Repeater 81130A Pattern Generator or BERT 50 eUSB2 Test Channel 22.1 22.1 15.8 15.8 Test Channel 86100 Scope or BERT 50 USB 2.0 Vin * 0.76 Vin scaled for impedance conversion 40 45 Impedance conversion Impedance conversion eUSB2 USB2 Figure 7-1. USB 2.0 TX Output (Egress) Jitter, Eye Mask Test Setup Repeater 86100 Scope or BERT 50 eUSB2 Test Channel 22.1 22.1 15.8 15.8 Test Channel 81130A Pattern Generator or BERT 50 USB 2.0 Vin * 0.693 Vin scaled for impedance conversion 40 45 Impedance conversion Impedance conversion USB 2.0 High speed test packets USB 2.0 TX Vpp * 0.68 Vout scaled for impedance conversion eUSB2 USB2 Figure 7-2. eUSB2 TX Output (Ingress) Jitter, Eye Mask Test Setup www.ti.com TUSB2E221 SNLS757B – JUNE 2024 – REVISED NOVEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 21 Product Folder Links: TUSB2E221 |
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