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SCBU014 データシート(PDF) 18 Page - Texas Instruments |
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SCBU014 データシート(HTML) 18 Page - Texas Instruments |
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18 / 34 page ![]() www.ti.com 3.1 Low Definition 3.2 Wafer Identification Code1 ReferenceDie Code2 Notch Low Definition A definite quantity of wafers from the same diffusion batch produced under presumed uniform conditions. Occasionally a lot equals 25 wafers. Each wafer is marked with laser marking to identify the wafer. The wafer map file is linked to the wafer id. There are 2 marks on the wafer. The following figure shows the position of the wafer identification codes. The reference die is the black marked die in the corner at the right lower position of the wafer. Figure 3-1. Position of Wafer Identification Code 18 Shipping, Packing and Further Handling SCBU047 (11-09-21-064) – October 2007 Submit Documentation Feedback |
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