L9907_V01 datasheet(16/49 Pages) STMICROELECTRONICS

16 / 49 page

Functional description

L9907

16/49

DS11800 Rev 5

2.9

Device and FET fault handling

All internal fault events are filtered to achieve noise immunity. After filter-time they are

latched in the corresponding SPI register and the FS_FLAG (active low) becomes low. In

case the related driver-disable-bit (EN_x) is set, additionally the gate driver will be disabled

and actively discharged (see: Fault Effect enabling; Table 35 and 32). In case EN_x is

disabled the µC takes fully response to react on any errors immediately indicated by the

FS_FLAG. Neither the boost nor the FET drivers will be disabled on deselected faults.

Table 6. Device and FET fault handling

Fault

Diagnosis

Device action when

EN_x enabled

Exit from fault condition

Overtemperature

FS_FLAG = low;

THSD SPI bit set

FET driver functionality

disabled

– Remove fault => auto recovery

– SPI read clears the Fault Flags and

sets FS_FLAG to high

VB or VCC over- or

undervoltage

FS_FLAG = low;

VBOV or VBUV or

VCCOV or VCCUV SPI

bit set

FET driver functionality

and Boost disabled

– Remove fault => auto recovery of

Boost

– EN cycling toggle reactivates the FET

driver

– SPI read clears the Fault Flags and

sets FS_FLAG to high

Boost HS or LS

undervoltage

FS_FLAG = low;

UV_HS or UV_LS SPI

bit set

FET driver functionality

disabled

– Remove fault

– EN cycling toggle reactivates the FET

driver

– SPI read clears the Fault Flags and

sets FS_FLAG to high

VSC_HSx

overcurrent

FS_FLAG = low;

VSC_HSx SPI bit set

FET driver functionality

disabled

– Remove fault

– EN cycling toggle reactivates the FET

driver

– SPI read clears the Fault Flags and

sets FS_FLAG to high

VSC_LSx

overcurrent

FS_FLAG = low;

VSC_LSx SPI bit set

FET driver functionality

disabled

– Remove fault

– EN cycling toggle reactivates the FET

driver

– SPI read clears the Fault Flags and

sets FS_FLAG to high

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