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L9908 データシート(PDF) 106 Page - STMicroelectronics |
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L9908 データシート(HTML) 106 Page - STMicroelectronics |
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106 / 152 page ![]() Symbol Parameter Test condition Min Typ Max Unit Cload_max = 200 pF including parasitics SPI_tcsdv NCS=LOW to data at SDO active Cload_max = 200 pF inlcuding parasitics - - 200 ns SPI_tpchdz NCS L/H to SDO at high-Z Cload_max = 200 pF including parasitics - - 200 ns SPI_tsclch SCLK before NCS low (2) 50 - - ns SPI_thclcl SCLK change L/H after NCS=LOW (2) 130 - - ns SPI_tsclcl SCLK low before NCS high (2) 50 - - ns SPI_thclch SCLK high after NCS high (2) 50 - - ns SPI_tscld SDI input setup time (2) 20 - - ns SPI_thcld SDI input hold time (2) 20 - - ns SPI_tonNCS NCS min. high time (2) 650 - - ns SPI_tclh Minimum time SCLK=HIGH (2) 45 - - ns SPI_tcll Minimum time SCLK=LOW (2) 45 - - ns SPI_Cin Input pin capacitance (2) - - 30 pF SPI_Cout_hiz MISO output pin capacitance in tri-state (2) - - 50 pF 1. SPI max frequency may be less depending on the total capacitive load or MCU timing requirements. 2. Not subject to production test, specified by design - not tested in production. Note: All parameters are guaranteed, and tested, in the voltage ranges reported above in Table 5 unless otherwise specified. Where not specified the parametrical operating range equals the functional operating range. L9908 Functional description DS13546 - Rev 5 page 106/152 |
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