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APM32E103CEU6-R データシート(PDF) 57 Page - Geehy Semiconductor Co., Ltd.

部品番号 APM32E103CEU6-R
部品情報  Arm® Cortex®-M3 based 32-bit MCU
PDF  79 Pages
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メーカー  GEEHY [Geehy Semiconductor Co., Ltd.]
ホームページ  https://global.geehy.com/
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APM32E103CEU6-R データシート(HTML) 57 Page - Geehy Semiconductor Co., Ltd.

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Pag e 56
Avg_Slope(1)
Average slope
(VDD = 3.3V, TA = -40~105°C)
4.1
4.2
4.5
mV/ºC
V25
Voltage at 25ºC (VDD =2.4-3.6V)
1.38
1.41
1.44
V
tSTART(2)
Setup Time
4
10
μs
TS_temp(2) (3)
ADC sampling Time when reading the temperature
17.1
μs
(1)
Data is guaranteed by analysis on features, and is not tested in production.
(2)
Data is guaranteed from design, and is not tested in production.
(3)
The shortest sampling Time can be determined by the application through multiple
iterations.
Table 2. Temperature Sensor Features
Symbol
Parameters
Minimum
Value
Typical
Value
Maximum
Value
Unit
Avg_Slope(1)
Average slope
(VDD = 3.3V, TA = -40~105°C)
4.1
4.2
4.5
mV/ºC
V25
Voltage at 25ºC (VDD =2.4-3.6V)
1.38
1.41
1.44
V
tSTART(2)
Setup Time
4
10
μs
TS_temp(2) (3)
ADC sampling Time when reading the temperature
17.1
μs
(4)
Data is guaranteed by analysis on features, and is not tested in production.
(5)
Data is guaranteed from design, and is not tested in production.
(6)
The shortest sampling Time can be determined by the application through multiple
iterations.
Table 3. Temperature Sensor Features
Symbol
Parameters
Minimum
Value
Typical
Value
Maximum
Value
Unit
Avg_Slope(1)
Average slope
(VDD = 3.3V, TA = -40~105°C)
4.1
4.2
4.5
mV/ºC
V25
Voltage at 25ºC (VDD =2.4-3.6V)
1.38
1.41
1.44
V
tSTART(2)
Setup Time
4
10
μs
TS_temp(2) (3)
ADC sampling Time when reading the temperature
17.1
μs
(7)
Data is guaranteed by analysis on features, and is not tested in production.
(8)
Data is guaranteed from design, and is not tested in production.
(9)
The shortest sampling Time can be determined by the application through multiple
iterations.



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