MIL-PRF-19500/376E

11

4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following

requirements:

a.

For JAN, JANTX, and JANTXV, samples shall be selected randomly from a minimum of three wafers (or

from each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection

lot. See MIL-PRF-19500.

b.

Must be chosen from an inspection lot that has been submitted to and passed group A, subgroup 2

conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high

temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and

JANTXV) may be pulled prior to the application of final lead finish.

4.4.3 Group C inspection, Group C inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table VII of MIL-PRF-19500, and in 4.4.3.1 (JANS).and 4.4.3.2 (JAN, JANTX, and JANTXV)

herein for group C testing. Electrical measurements (end-points) shall be in accordance with group A, subgroup 2

herein. Delta requirements shall be in accordance with table III herein.

4.4.3.1 Group C inspection, table VII (JANS) of MIL-PRF-19500.

Subgroup

Method

Condition

C2

2036

Test condition E (not applicable to UA and UB suffix devices).

C6

1026

°C minimum

herein.

4.4.3.2 Group C inspection, table VII (JAN, JANTX, and JANTXV) of MIL-PRF-19500.

Subgroup

Method

Condition

C2

2036

Test condition E (not applicable to UA and UB suffix devices).

C6

Not applicable.

4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any

inspection lot containing the intended package type and lead finish procured to the same specification which is

submitted to and passes group A tests for conformance inspection. Testing of a subgroup using a single device

type enclosed in the intended package type shall be considered as complying with the requirements for that

subgroup.

4.4.4 Group E inspection. Group E inspection shall be performed for qualification or re-qualification only. The

tests specified in table II herein must be performed to maintain qualification.

4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.

4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-

750.