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2N2484 データシート(PDF) 16 Page - STMicroelectronics

部品番号 2N2484
部品情報  SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N2484, 2N2484UA, 2N2484UB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
PDF  19 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

2N2484 データシート(HTML) 16 Page - STMicroelectronics

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MIL-PRF-19500/376E
16
TABLE III. Groups B and C delta measurements. 1/ 2/ 3/
Step
Inspection
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
1
Forward-current transfer
ratio
3076
VCE = 5 V dc; IC = 500
µA dc; pulsed see 4.5.1
4/
∆hFE4
±25 percent change from
initial recorded reading
2.
Collector to emitter
voltage (saturated)
3071
IC = 1.0 mA dc; IB = 100
µA dc
∆VCE(sat)
4/ 5/
±50 mV dc change from
previously measured value.
3.
Collector to emitter
cutoff current
3041
Bias condition C;
VCB = 45 V dc
∆ICES
4/
100 percent of initial value
or 2 nA dc, whichever is
greater.
1/
The delta measurements for group B, table VIa (JANS) of MIL-PRF-19500 are as follows:
a.
Subgroup 4, see table III herein, step 2.
b.
Subgroup 5, see table III herein, steps 1 and 3.
2/
The delta measurements for 4.4.2.2 herein (group B, JAN, JANTX, and JANTXV) are as follows: Steps 2
and 3 of table III shall be performed after each step in 4.4.2.2 herein.
3/
The delta measurements for group C, table VII of MIL-PRF-19500 are as follows: Subgroup 6, see table III
herein, steps 1 and 3 for JANS, step 1 for JAN, JANTX, and JANTXV.
4/
Devices which exceed the group A limits for this test shall not be accepted.
5/
Applies to JANS level only.



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