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2N2484 データシート(PDF) 16 Page - STMicroelectronics |
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2N2484 データシート(HTML) 16 Page - STMicroelectronics |
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16 / 19 page ![]() MIL-PRF-19500/376E 16 TABLE III. Groups B and C delta measurements. 1/ 2/ 3/ Step Inspection MIL-STD-750 Symbol Limit Unit Method Conditions 1 Forward-current transfer ratio 3076 VCE = 5 V dc; IC = 500 µA dc; pulsed see 4.5.1 4/ ∆hFE4 ±25 percent change from initial recorded reading 2. Collector to emitter voltage (saturated) 3071 IC = 1.0 mA dc; IB = 100 µA dc ∆VCE(sat) 4/ 5/ ±50 mV dc change from previously measured value. 3. Collector to emitter cutoff current 3041 Bias condition C; VCB = 45 V dc ∆ICES 4/ 100 percent of initial value or 2 nA dc, whichever is greater. 1/ The delta measurements for group B, table VIa (JANS) of MIL-PRF-19500 are as follows: a. Subgroup 4, see table III herein, step 2. b. Subgroup 5, see table III herein, steps 1 and 3. 2/ The delta measurements for 4.4.2.2 herein (group B, JAN, JANTX, and JANTXV) are as follows: Steps 2 and 3 of table III shall be performed after each step in 4.4.2.2 herein. 3/ The delta measurements for group C, table VII of MIL-PRF-19500 are as follows: Subgroup 6, see table III herein, steps 1 and 3 for JANS, step 1 for JAN, JANTX, and JANTXV. 4/ Devices which exceed the group A limits for this test shall not be accepted. 5/ Applies to JANS level only. |
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