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TAT07-R01 データシート(PDF) 9 Page - EM Microelectronic - MARIN SA |
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TAT07-R01 データシート(HTML) 9 Page - EM Microelectronic - MARIN SA |
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9 / 17 page ![]() 365324.CP37 / B This document is the property of EM MICROELECTRONIC-MARIN SA and is furnished in confidence and upon the condition that all rights originating in the information, whether patented or not, will be respected. EM Document Center/04.08 - Page 9 of 17 7.3 SHIPPING INSPECTION STANDARDS 7.3.1 Shipping Inspection Standards Sampling size : MIL_STD_105D, single sampling, Inspection level II RANK DEFECT AQL level Major defect No display Short circuit Outside dimensions 0.1 Minor defect Display missing Pattern misalignment Spots, streaks Bubbles Chromaticity and uniformity Polarizer defects Glass defects Dirt, spots Current consumption FPC 0.65 7.3.2 Zone Definitions Shipment inspection is performed under dividing zone A and B. 7.3.3 Visual Inspection Inspect under 30W fluorescent lamp, leaving 30cm between panel and eyes, and between panel and lights. 7.3.4 Limit Sample If a judgement cannot be made according to the delivery specification, limit samples must be agreed on and used. B Outside viewing area A Viewing area Display |
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