Data Sheet

7

Rev. 1.1, 2008-09-24

TLE42754

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

-40 °C

(unless otherwise specified)

1) Not subject to production test, specified by design.

Pos.

Parameter

Symbol

Limit Values

Unit

Conditions

Min.

Max.

Input

4.1.1

Voltage

V

I

-42

45

V

–

Output

4.1.2

Voltage

V

Q

-0.3

7

V

–

Reset Output

4.1.3

Voltage

V

RO

-0.3

25

V

–

Reset Delay

4.1.4

Voltage

V

D

-0.3

7

V

–

Temperature

4.1.5

Junction Temperature

T

j

-40

150

°C–

4.1.6

Storage Temperature

T

stg

-50

150

°C–

ESD Absorption

4.1.7

ESD Absorption

V

ESD,HBM

-2

2

kV

Human Body

2) ESD HBM Test according AEC-Q100-002 - JESD22-A114

4.1.8

V

ESD,CDM

-500

500

V

Charge Device

3) ESD CDM Test according ESDA STM5.3.1

4.1.9

-750

750

V

Charge Device

Model (CDM)3) at

corner pins