データシートサーチシステム
  Japanese  ▼
ALLDATASHEET.JP

X  

AD9765AST データシート(PDF) 8 Page - Analog Devices

部品番号 AD9765AST
部品情報  10-/12-/14-Bit, 125 MSPS Dual TxDAC Digital-to-Analog Converters
PDF  44 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
メーカー  AD [Analog Devices]
ホームページ  http://www.analog.com
Logo AD - Analog Devices

AD9765AST データシート(HTML) 8 Page - Analog Devices

Back Button AD9765AST Datasheet HTML 4Page - Analog Devices AD9765AST Datasheet HTML 5Page - Analog Devices AD9765AST Datasheet HTML 6Page - Analog Devices AD9765AST Datasheet HTML 7Page - Analog Devices AD9765AST Datasheet HTML 8Page - Analog Devices AD9765AST Datasheet HTML 9Page - Analog Devices AD9765AST Datasheet HTML 10Page - Analog Devices AD9765AST Datasheet HTML 11Page - Analog Devices AD9765AST Datasheet HTML 12Page - Analog Devices Next Button
Zoom Inzoom in Zoom Outzoom out
 8 / 44 page
background image
AD9763/AD9765/AD9767
Data Sheet
Rev. G | Page 8 of 44
ABSOLUTE MAXIMUM RATINGS
THERMAL RESISTANCE
Table 4.
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Parameter
With
Respect To
Rating
AVDD
ACOM
−0.3 V to +6.5 V
DVDD1, DVDD2
DCOM1/DCOM2
−0.3 V to +6.5 V
ACOM
DCOM1/DCOM2
−0.3 V to +0.3 V
AVDD
DVDD1/DVDD2
−6.5 V to +6.5 V
MODE,
CLK1/IQCLK,
CLK2/IQRESET,
WRT1/IQWRT,
WRT2/IQSEL
DCOM1/DCOM2
−0.3 V to DVDD1/
DVDD2 + 0.3 V
Digital Inputs
DCOM1/DCOM2
−0.3 V to DVDD1/
DVDD2 + 0.3 V
IOUTA1/IOUTA2,
IOUTB1/IOUTB2
ACOM
−1.0 V to AVDD + 0.3 V
REFIO, FSADJ1,
FSADJ2
ACOM
−0.3 V to AVDD + 0.3 V
GAINCTRL, SLEEP
ACOM
−0.3 V to AVDD + 0.3 V
Junction
Temperature
150°C
Storage
Temperature
Range
−65°C to +150°C
Lead Temperature
(10 sec)
300°C
Table 5. Thermal Resistance
Package Type
θJA
Unit
48-Lead LQFP
91
°C/W
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44


データシート ダウンロード

Go To PDF Page


リンク URL



ALLDATASHEETはお客様のビジネスに役立ちますか?  [ DONATE ] 

Alldatasheetは   |   広告   |   お問い合わせ   |   プライバシーポリシー   |   データシートへのリンク    |   リンク交換   |   メーカーリスト
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com