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STM32L152C6 データシート(PDF) 92 Page - STMicroelectronics

部品番号 STM32L152C6
部品情報  Ultra-low-power 32-bit MCU ARM-based Cortex-M3, 128KB Flash, 16KB SRAM, 4KB EEPROM, LCD, USB, ADC, DAC
PDF  121 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
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STM32L152C6 データシート(HTML) 92 Page - STMicroelectronics

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Electrical characteristics
STM32L151x6/8/B, STM32L152x6/8/B
92/121
Doc ID 17659 Rev 8
Table 55.
ADC accuracy(1)(2)
Symbol
Parameter
Test conditions
Min(3)
Typ
Max(3)
Unit
ET
Total unadjusted error
2.4 V
≤ VDDA ≤ 3.6 V
2.4 V
≤ VREF+ ≤ 3.6 V
fADC = 8 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
-2
4
LSB
EO
Offset error
-
1
2
EG
Gain error
-
1.5
3.5
ED
Differential linearity error
-
1
2
EL
Integral linearity error
-
1.7
3
ENOB
Effective number of bits
2.4 V
≤ VDDA ≤ 3.6 V
VDDA = VREF+
fADC = 16 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
1 kHz
≤ Finput ≤ 100 kHz
9.2
10
-
bits
SINAD
Signal-to-noise and
distorsion ratio
57.5
62
-
dB
SNR
Signal-to-noise ratio
57.5
62
-
THD
Total harmonic distorsion
-74
-75
-
ET
Total unadjusted error
2.4 V
≤ VDDA ≤ 3.6 V
1.8 V
≤ VREF+ ≤ 2.4 V
fADC = 4 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
-4
6.5
LSB
EO
Offset error
-
2
4
EG
Gain error
-
4
6
ED
Differential linearity error
-
1
2
EL
Integral linearity error
-
1.5
3
ET
Total unadjusted error
1.8 V
≤ VDDA ≤ 2.4 V
1.8 V
≤ VREF+ ≤ 2.4 V
fADC = 4 MHz, RAIN = 50 Ω
TA = -40 to 105 °C
23
LSB
EO
Offset error
1
1.5
EG
Gain error
1.5
2
ED
Differential linearity error
1
2
EL
Integral linearity error
1
1.5
1.
ADC DC accuracy values are measured after internal calibration.
2.
ADC accuracy vs. negative injection current: Injecting a negative current on any analog input pins should be avoided as this
significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a
Schottky diode (pin to ground) to analog pins which may potentially inject negative currents.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.11 does not affect the ADC
accuracy.
3.
Based on characterization, not tested in production.



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