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STM32L152C6 データシート(PDF) 78 Page - STMicroelectronics |
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STM32L152C6 データシート(HTML) 78 Page - STMicroelectronics |
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78 / 121 page  Electrical characteristics STM32L151x6/8/B, STM32L152x6/8/B 78/121 Doc ID 17659 Rev 8 Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error, out of spec current injection on adjacent pins or other functional failure (for example reset, oscillator frequency deviation, LCD levels, etc.). The test results are given in the following table. Table 41. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on true open-drain pins -5 +0 mA Injected current on all 5 V tolerant (FT) pins -5 +0 Injected current on any other pin -5 +5 |
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