IDT71342LA55PF datasheet(4/13 Pages) IDT

4 / 13 page

IDT71342SA/LA

HIGH-SPEED 4K x 8 DUAL-PORT STATIC RAM WITH SEMAPHORE

COMMERCIAL TEMPERATURE RANGE

6.05

DATA RETENTION CHARACTERISTICS

(LA Version Only) VLC = 0.2V, VHC = VCC - 0.2V

Symbol

Parameter

Test Condition

Min.

Typ.

(1)

Max.

Unit

VDR

VCC for Data Retention

—

2.0

—

ICCDR

Data Retention Current

VCC = 2V,

CE ≥ VHC

COM’L.

—

100

1500

µA

SEM ≥ VHC

tCDR

(3)

Chip Deselect to Data Retention Time

VIN

≥ VHC or ≤ VLC

0—

—

(3)

Operation Recovery Time

tRC

(2)

——

2721 tbl 07

NOTES:

1. VCC = 2V, TA = +25

°C, and are not production tested.

2. tRC = Read Cycle Time.

3. This parameter is guaranteed by device characterization, but is not production tested.

DATA RETENTION WAVEFORM

AC TEST CONDITIONS

Input Pulse Levels

GND to 3.0V

Input Rise/Fall Times

5ns

Input Timing Reference Levels

1.5V

Output Reference Levels

1.5V

Output Load

Figures 1 and 2

2721 tbl 08

VCC

DATA RETENTION MODE

4.5V

VDR

≥ 2V

VDR

VIH

tCDR

2721 drw 04

+5V

1250

Ω

30pF

775

Ω

DATAOUT

2721 drw 05

+5V

1250

Ω

5pF *

775

Ω

DATAOUT

2721 drw 06

Figure 2. Output Test Load

(for tLZ, tHZ, tWZ, tOW)

*Including scope and jig

Figure 1. AC Output Test Load

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