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KAF-8300 データシート(PDF) 13 Page - ON Semiconductor |
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KAF-8300 データシート(HTML) 13 Page - ON Semiconductor |
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13 / 28 page  KAF−8300 www.onsemi.com 13 DEFECT DEFINITIONS Table 7. OPERATIONAL CONDITIONS (The Defect Specifications are measured using the following conditions.) Description Test Condition Notes Integration Time (tINT) 33 ms Unless Otherwise Noted Operating Temperature 60 °C Unless Otherwise Noted Table 8. SPECIFICATIONS Description Symbol Definition Threshold Maximum Number Allowed Notes COLOR DEVICES Point Defect BPnt33_7 Dark Field, Minor, Short Integration Time 7.5 mV 800 Total Points Allowed for this Group of Tests 3 Point Defect Bfld_Pnt_D Dark Point in an Illuminated Field 11% 3 Point Defect Bfld_Pnt_B Bright Point in an Illuminated Field 7% 3 Point Defect BPnt33_100 Dark Field, Major, Short Integration Time 10 mV 3 Point Defect BPnt33_500 Dark Field, Major, Short Integration Time 500 mV 0 3 Point Defect BPnt333_13 Dark Field, Minor, Long Integration Time, tINT = 1/3 s 13 mV 32,500 1, 3, 4 Point Defect DR_BPnts Bright Point in the Dark Reference Region 7.5 mV 0 5 Cluster Defect Total_Clst A Cluster is a Group of 2 or more Defective Pixels that do not Exceed the Perpendicular Pattern Defect − 6 Total 3 Cluster Defect Dfld_Vperp Dark Field Very Long Exposure Bright Cluster where 9 or more Adjacent Point Defects Exist, Very Long Integration Time, tINT = 1 s 3.04 mV 0 3 Cluster Defect − Perpendicular Pattern Defect Dfld_Perp Bfld_Perp Total_Perp Three or more Adjacent Point Defects in the Same Color Plane, along a Row or Column − 0 2, 3 Column Defect, Illuminated Bfld_Col_D Bfld_Col_B A Column which Deviates above or below Neighboring Columns under Illuminated Conditions (> 300 mV Signal) greater that the Threshold 1.5% 1.5% 0 3 Column Defect, Dark Field Dfld_Col2 Dfld_Col4 Lo_Col_B Lo_Col_D Lo_Col_B1 Lo_Col_D1 A Column which Deviates above or below Neighboring Columns under Non-Illuminated or Low Light Level Conditions (~10 mV) greater than the Threshold 1 mV 1 mV 1 mV 1 mV 1 mV 1 mV 0 3 3 5 5 5 5 Row Defect Dfld_Row Row Defect if Row Average Deviates above Threshold 1 mV 0 3 LOD Bright Col, Dark Dfld_LodCol Defines Functionality and Uniform Efficiency of LOD Structure 1.5 mV 0 3 Streak Test, Color GrnStreak RedStreak BluStreak Maximum Defect Density Gradient Allowed in a Color Bit Plane (Note 4) 40% 20% 20% 0 Streak Test, Color MONOCHROME DEVICES Point Defect, Dark Field BPnt33_7 Dark Field, Minor, Short Integration Time 7.5 mV 800 Point Defect, Dark Field BPnt33_100 Dark Field, Major, Short Integration Time 100 mV 6 Point Defect, Dark Field DfBP_33_200 Dark Field, Major, Short Integration Time 200 mV 0 Point Defect, Dark Field BPnt33_500 Dark Field, Major, Short Integration Time 500 mV 0 Point Defect, Bright Field Bfld_Pnt_D Dark Point in an Illuminated Field, Short Integration Time 11% 800 Point Defect, Bright Field Bfld_Pnt_B Bright Point in an Illuminated Field, Short Integration Time 7% 800 |
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