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STAP08DP5XTTR データシート(PDF) 19 Page - STMicroelectronics |
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STAP08DP5XTTR データシート(HTML) 19 Page - STMicroelectronics |
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19 / 28 page ![]() DocID024305 Rev 6 19/28 STAP08DP05 Detection mode functionality 28 10 Detection mode functionality 10.1 Phase one: “entering error detection mode“ From the “normal mode” condition the device can switch to “error detection mode” by a logic sequence on the OE/DM2 and LE/DM1 pins as shown in the following table and diagram. After these five CLK cycles the device goes into the “error detection mode” and at the 6th rising edge of CLK, the SDI data are ready for sampling. Table 12. Entering error detection mode truth table CLK 1°2°3°4°5° OE/DM2 H L HHH LE/DM1 LLL H L Figure 17. Entering error detection mode timing diagram |
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