DG183/184/185

Siliconix

S-52895—Rev. D, 16-Jun-97

3

Test Conditions

Unless Otherwise Specified

V+=15V V = 15V V =5V

A Suffix

–55 to 125

_C

B Suffix

–25 to 85

_C

Parameter

Symbol

Unit

Analog Switch

Full

–7.5

15

–7.5

15

V

Drain-Source

On-Resistance

Room

Full

7.5

10

20

15

25

W

Source Off

Lk

C

V+ = 10 V, V– = –20 V

Room

Hot

0.05

10

1000

15

300

Leakage Current

Room

Hot

0.05

10

1000

15

300

Drain Off

Lk

C

V+ = 10 V, V– = –20 V

Room

Hot

0.04

10

1000

15

300

nA

Leakage Current

Room

Hot

0.03

10

1000

15

300

Channel On

Leakage Current

Room

Hot

–0.1

–2

–200

–10

–200

Saturation Drain Current

2 ms Pulse Duration

Room

300

mA

Digital Input

Input Current with

Input Voltage High

Room

Hot

<0.01

10

20

10

20

mA

Input Current with

Input Voltage Low

Full

–30

–250

–250

mA

Dynamic Characteristics

Turn-On Time

See Switching Time Test Circuit

Room

240

400

600

ns

Turn-Off Time

See Switching Time Test Circuit

Room

140

200

220

ns

Source-Off Capacitance

Room

21

Drain-Off Capacitance

f = 1 MHz

Room

17

pF

Channel-On Capacitance

Room

17

Off Isolation

OIRR

Room

>55

dB

Power Supplies

Positive Supply Current

I+

Room

0.6

1.5

1.5

Negative Supply Current

I–

Room

–2.7

–5

–5

mA

Logic Supply Current

Room

3.1

4.5

4.5

mA

Reference Supply Current

Room

–1

–2

–2

Notes:

a.

Refer to PROCESS OPTION FLOWCHART .

b.

Room = 25

_C, Full = as determined by the operating temperature suffix.

c.

Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.

d.

The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.

e.

Guaranteed by design, not subject to production test.

f.