DG183/184/185

Siliconix

S-52895—Rev. D, 16-Jun-97

5

Test Conditions

Unless Otherwise Specified

V15 V V

15 V V

5 V

A Suffix

–55 to 125

_C

B Suffix

–25 to 85

_C

Parameter

Symbol

Unit

Analog Switch

Full

–10

15

–10

15

V

Drain-Source

On-Resistance

Room

Full

35

75

150

100

150

W

Source Off

Lk

C

V+ = 10 V, V– = –20 V

Room

Hot

0.05

1

100

5

100

Leakage Current

Room

Hot

0.07

1

100

5

100

Drain Off

Lk

C

V+ = 10 V, V– = –20 V

Room

Hot

0.4

1

100

5

100

nA

Leakage Current

Room

Hot

0.3

1

100

5

100

Channel On

Leakage Current

Room

Hot

–0.03

–2

–200

–10

–200

Digital Input

Input Current with

Input Voltage High

Room

Hot

<0.01

10

20

10

20

mA

Input Current with

Input Voltage Low

Full

–30

–250

–250

mA

Dynamic Characteristics

Turn-On Time

See Switching Time Test Circuit

Room

120

250

300

ns

Turn-Off Time

See Switching Time Test Circuit

Room

100

130

150

ns

Source-Off Capacitance

Room

9

Drain-Off Capacitance

f = 1 MHz

Room

6

pF

Channel-On Capacitance

Room

14

Off Isolation

OIRR

Room

>50

dB

Power Supplies

Positive Supply Current

I+

Room

0.6

3

3

Negative Supply Current

I–

Room

–2.7

–5.5

–5.5

Logic Supply Current

Room

3.1

4.5

4.5

mA

Reference Supply Cur-

rent

Room

–1

–2

–2

Notes:

a.

Refer to PROCESS OPTION FLOWCHART .

b.

Room = 25

_C, Full = as determined by the operating temperature suffix.

c.

Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.

d.

The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.

e.

Guaranteed by design, not subject to production test.

f.