STM32L471VG datasheet(37/218 Pages) STMICROELECTRONICS

37 / 218 page

DocID027226 Rev 1

37/218

STM32L471xx

Functional overview

3.15

Analog to digital converter (ADC)

The device embeds 3 successive approximation analog-to-digital converters with the

following features:

•

12-bit native resolution, with built-in calibration

•

5.33 Msps maximum conversion rate with full resolution

–

Down to 18.75 ns sampling time

–

Increased conversion rate for lower resolution (up to 8.88 Msps for 6-bit

resolution)

•

Up to 24 external channels, some of them shared between ADC1 and ADC2, or ADC1,

ADC2 and ADC3.

•

5 Internal channels: internal reference voltage, temperature sensor, VBAT/3, DAC1 and

DAC2 outputs.

•

One external reference pin is available on some package, allowing the input voltage

range to be independent from the power supply

•

Single-ended and differential mode inputs

•

Low-power design

–

Capable of low-current operation at low conversion rate (consumption decreases

linearly with speed)

–

Dual clock domain architecture: ADC speed independent from CPU frequency

•

Highly versatile digital interface

–

Single-shot or continuous/discontinuous sequencer-based scan mode: 2 groups

of analog signals conversions can be programmed to differentiate background and

high-priority real-time conversions

–

Handles two ADC converters for dual mode operation (simultaneous or

interleaved sampling modes)

–

Each ADC support multiple trigger inputs for synchronization with on-chip timers

and external signals

–

Results stored into 3 data register or in RAM with DMA controller support

–

Data pre-processing: left/right alignment and per channel offset compensation

–

Built-in oversampling unit for enhanced SNR

–

Channel-wise programmable sampling time

–

Three analog watchdog for automatic voltage monitoring, generating interrupts

and trigger for selected timers

–

Hardware assistant to prepare the context of the injected channels to allow fast

context switching

3.15.1

Temperature sensor

The temperature sensor (TS) generates a voltage VTS that varies linearly with temperature.

The temperature sensor is internally connected to the ADC1_IN17 and ADC3_IN17 input

channels which is used to convert the sensor output voltage into a digital value.

The sensor provides good linearity but it has to be calibrated to obtain good overall

accuracy of the temperature measurement. As the offset of the temperature sensor varies

from chip to chip due to process variation, the uncalibrated internal temperature sensor is

suitable for applications that detect temperature changes only.

STM32L471VG データシート(PDF) 37 Page - STMicroelectronics

STM32L471VG データシート(HTML) 37 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

データシートダウンロード