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HT27C010 データシート(PDF) 6 Page - Holtek Semiconductor Inc |
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HT27C010 データシート(HTML) 6 Page - Holtek Semiconductor Inc |
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6 / 15 page ![]() Product Identification Code Code Pins Hex Data A0 A1 DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0 Manufacturer 0100011100 1C Device Type 1100000001 01 Continuation 0001111111 7F 1001111111 7F HT27C010 Rev. 1.10 6 November 21, 2002 System considerations During the switch between active and standby condi- tions, transient current peaks are produced on the rising and falling edges of Chip Enable. The magnitude of these transient current peaks is dependent on the out- put capacitance loading of the device. At a minimum, a 0.1 mF ceramic capacitor (high frequency, low inherent inductance) should be used on each device between VCC and VPP to minimize transient effects. In addition, to overcome the voltage drop caused by the inductive effects of the printed circuit board traces on EPROM ar- rays, a 4.7 mF bulk electrolytic capacitor should be used between VCC and VPP for each eight devices. The lo- cation of the capacitor should be close to where the power supply is connected to the array. Operation mode truth table All the operation modes are shown in the table following. Mode CE OE PGM A0 A1 A9 VPP Output Read VIL VIL X (2) X X X VCC Dout Output Disable VIL VIH XXXX VCC High Z Standby (TTL) VIH XXXXX VCC High Z Standby (CMOS) VCC± 0.3V XXXXX VCC High Z Program VIL VIH VIL XXX VPP DIN Program Verify VIL VIL VIH XXX VPP DOUT Product Inhibit VIH XXXXX VPP High Z Manufacturer Code (3) VIL VIL XVIL VIH VH (1) VCC 1C Device Type Code (3) VIL VIL XVIH VIH VH (1) VCC 01 Note: (1) VH=12.0V ± 0.5V (2) X=Either VIH or VIL (3) For Manufacturer Code and Device Code, A1=VIH, When A1=VIL, both codes will read 7F O E A d d r e s s A d d r e s s V a l i d t C E t O E t A C C H I G H Z O u t p u t V a l i d t O H t D . O u t p u t C E Figure 1. A.C. waveforms for read operation |
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