SN74LVC2G38

DUAL 2INPUT NAND GATE

WITH OPEN DRAIN OUTPUT

SCES554A − MARCH 2004 − REVISED OCTOBER 2004

3

POST OFFICE BOX 655303

recommended operating conditions (see Note 4)

MIN

MAX

UNIT

VCC

Supply voltage

Operating

1.65

5.5

V

VCC

Supply voltage

Data retention only

1.5

V

VCC = 1.65 V to 1.95 V

0.65

× VCC

VIH

High-level input voltage

VCC = 2.3 V to 2.7 V

1.7

V

VIH

High-level input voltage

VCC = 3 V to 3.6 V

2

V

VCC = 4.5 V to 5.5 V

0.7

× VCC

VCC = 1.65 V to 1.95 V

0.35

× VCC

VIL

Low-level input voltage

VCC = 2.3 V to 2.7 V

0.7

V

VIL

Low-level input voltage

VCC = 3 V to 3.6 V

0.8

V

VCC = 4.5 V to 5.5 V

0.3

× VCC

VI

Input voltage

0

5.5

V

VO

Output voltage

0

VCC

V

VCC = 1.65 V

4

VCC = 2.3 V

8

IOL

Low-level output current

VCC = 3 V

16

mA

IOL

Low-level output current

VCC = 3 V

24

mA

VCC = 4.5 V

32

VCC = 1.8 V ± 0.15 V, 2.5 V ± 0.2 V

20

∆t/∆v

Input transition rise or fall rate

VCC = 3.3 V ± 0.3 V

10

ns/V

∆t/∆v

Input transition rise or fall rate

VCC = 5 V ± 0.5 V

5

ns/V

TA

Operating free-air temperature

−40

85

°C

NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

VCC

MIN

TYP†

MAX

UNIT

IOL = 100 mA

1.65 V to 5.5 V

0.1

IOL = 4 mA

1.65 V

0.45

V

IOL = 8 mA

2.3 V

0.3

V

VOL

IOL = 16 mA

3 V

0.4

V

IOL = 24 mA

3 V

0.55

IOL = 32 mA

4.5 V

0.55

II

A or B inputs

VI = 5.5 V or GND

0 to 5.5 V

±1

mA

Ioff

VI or VO = 5.5 V

0

±10

mA

ICC

VI = 5.5 V or GND,

IO = 0

1.65 V to 5.5 V

10

mA

∆ICC

One input at VCC − 0.6 V,

Other inputs at VCC or GND

3 V to 5.5 V

500

mA

Ci

VI = VCC or GND

3.3 V

4

pF

Co

VO = VCC or GND

3.3 V

4.5

pF

† All typical values are at VCC = 3.3 V, TA = 25°C.