ACE24AC02A3C

Two-wire Serial EEPROM

VER 1.1

1

Description

The ACE24AC02A3C is 2048 bits of serial Electrical Erasable and Programmable Read Only

Memory, commonly known as EEPROM. They are organized as 256 words of 8 bits (1 byte) each. The

devices are fabricated with proprietary advanced CMOS process for low power and low voltage

applications. These devices are available in standard 8-lead DIP, 8-lead SOP, 8-lead MSOP, 8-lead

TSSOP, 8-lead TDFN and 5-lead SOT-23-5/TSOT-23-5 packages. A standard 2-wire serial interface is

used to address all read and write functions. Our extended VCC range (1.8V to 5.5V) devices enables

wide spectrum of applications.

Features



Low voltage and low power operations:

ACE24AC02A3C: VCC = 1.8V to 5.5V, Industrial temperature range (-40℃ to 85℃).

ACE24AC02A3C-Kxx: With 3 bits device address, the devices are suitable for all application. (For

use of 5 pins package, the device address A2,A1,and A0 bits must be set to zero)



Maximum Standby current < 1µA (typically 0.02µA and 0.06µA @ 1.8V and 5.5V respectively).



16 bytes page write mode.



Partial page write operation allowed.



Internally organized: 256 × 8 (2K).



Standard 2-wire bi-directional serial interface.



Schmitt trigger, filtered inputs for noise protection.



Self-timed programming cycle (5ms maximum).



1 MHz (2.5-5V), 400 kHz (1.8V) Compatibility.



Automatic erase before write operation.



Write protect pin for hardware data protection.



High reliability: typically 1,000,000 cycles endurance.



100 years data retention.



Standard 8-pin DIP/SOP/MSOP/TSSOP/TDFN and 5-pin SOT-23-5/TSOT-23-5 Pb-free packages.

Absolute Maximum Ratings

Industrial operating temperature

Storage temperature

Input voltage on any pin relative to ground

Maximum voltage

8V

ESD protection on all pins

>2000V

*Notice: Stresses exceed those listed under “Absolute Maximum Rating” may cause permanent damage to the device. Functional

operation of the device at conditions beyond those listed in the specification is not guaranteed. Prolonged exposure to extreme

conditions may affect device reliability or functionality.